| Literature DB >> 22380722 |
Brian Standley1, Anthony Mendez, Emma Schmidgall, Marc Bockrath.
Abstract
Graphene's high mobility and two-dimensional nature make it an attractive material for field-effect transistors. Previous efforts in this area have used bulk gate dielectric materials such as SiO(2) or HfO(2). In contrast, we have studied the use of an ultrathin layered material, graphene's insulating analogue, graphite oxide. We have fabricated transistors comprising single or bilayer graphene channels, graphite oxide gate insulators, and metal top-gates. The graphite oxide layers show relatively minimal leakage at room temperature. The breakdown electric field of graphite oxide was found to be comparable to SiO(2), typically ~1-3 × 10(8) V/m, while its dielectric constant is slightly higher, κ ≈ 4.3.Entities:
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Year: 2012 PMID: 22380722 DOI: 10.1021/nl2028415
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189