| Literature DB >> 22378625 |
Sarah Kim1, Dong Ok Shin, Dae-Geun Choi, Jong-Ryul Jeong, Jeong Ho Mun, Yong-Biao Yang, Jaeup U Kim, Sang Ouk Kim, Jun-Ho Jeong.
Abstract
A highly efficient, ultralarge-area nanolithography that integrates block-copolymer lithography with single-step ZnO nanoimprinting is introduced. The UV-assisted imprinting of a photosensitive sol-gel precursor creates large-area ZnO topographic patterns with various pattern shapes in a single-step process. This straightforward approach provides a smooth line edge and high thermal stability of the imprinted ZnO pattern; these properties are greatly advantageous for further graphoepitaxial block-copolymer assembly. According to the ZnO pattern shape and depth, the orientation and lateral ordering of self-assembled cylindrical nanodomains in block-copolymer thin films could be directed in a variety of ways. Significantly, the subtle tunability of ZnO trench depth enabled by nanoimprinting, generated complex hierarchical nanopatterns, where surface-parallel and surface-perpendicular nanocylinder arrays are alternately arranged. The stability of this complex morphology is confirmed by self-consistent field theory (SCFT) calculations. The highly ordered graphoepitaxial nanoscale assembly achieved on transparent semiconducting ZnO substrates offers enormous potential for photonics and optoelectronics.Entities:
Year: 2012 PMID: 22378625 DOI: 10.1002/smll.201101960
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281