Literature DB >> 22369762

Thermionic emission from the 2DEG assisted by image-charge-induced barrier lowering in AlInN/AlN/GaN heterostructures.

A Minj1, D Cavalcoli, A Cavallini.   

Abstract

The effect of image charges on current transport mechanisms investigated at the nanoscale in Al(1-x)In(x)N/GaN heterostructures was studied. Current-voltage (I-V) measurements were performed locally using a conductive AFM-tip as a nanoprobe and the conduction mechanism was modeled to explain the observed behavior. This model suggests that current transport is controlled by thermionic emission (TE) of the two-dimensional electron gas (2DEG) across the potential barrier at the heterointerface, where the image charges generated by the 2DEG induce a barrier lowering at the Al(1-x)In(x)N/GaN interface, enhancing electron transport. This barrier lowering depends on the 2DEG characteristics, such as 2DEG density n(2D), first subband energy E₀ and the average distance x₀ of the 2DEG from the interface. By fitting the experimental I-V curves with the present model the 2DEG density was evaluated. The obtained results were in very good agreement with the Hall measurements.

Entities:  

Year:  2012        PMID: 22369762     DOI: 10.1088/0957-4484/23/11/115701

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  Low Al-composition p-GaN/Mg-doped Al0.25Ga0.75N/n+-GaN polarization-induced backward tunneling junction grown by metal-organic chemical vapor deposition on sapphire substrate.

Authors:  Kexiong Zhang; Hongwei Liang; Yang Liu; Rensheng Shen; Wenping Guo; Dongsheng Wang; Xiaochuan Xia; Pengcheng Tao; Chao Yang; Yingmin Luo; Guotong Du
Journal:  Sci Rep       Date:  2014-09-10       Impact factor: 4.379

  1 in total

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