| Literature DB >> 22354578 |
J Karthik1, Anoop R Damodaran, Lane W Martin.
Abstract
Illustration of a new high-temperature hard-mask process based on traditional lithography and selective wet-etching of MgO. The hard mask is compatible with standard nano-lithography techniques and heat treatments in excess of 1000 °C. Here, this technique is applied to produce temperature-stable contacts that give rise to low leakage, improved fatigue properties, and excellent high-temperature stability in ferroelectric thin-film capacitors.Entities:
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Year: 2012 PMID: 22354578 DOI: 10.1002/adma.201104697
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849