Literature DB >> 22354535

Charge injection in solution-processed organic field-effect transistors: physics, models and characterization methods.

Dario Natali1, Mario Caironi.   

Abstract

A high-mobility organic semiconductor employed as the active material in a field-effect transistor does not guarantee per se that expectations of high performance are fulfilled. This is even truer if a downscaled, short channel is adopted. Only if contacts are able to provide the device with as much charge as it needs, with a negligible voltage drop across them, then high expectations can turn into high performances. It is a fact that this is not always the case in the field of organic electronics. In this review, we aim to offer a comprehensive overview on the subject of current injection in organic thin film transistors: physical principles concerning energy level (mis)alignment at interfaces, models describing charge injection, technologies for interface tuning, and techniques for characterizing devices. Finally, a survey of the most recent accomplishments in the field is given. Principles are described in general, but the technologies and survey emphasis is on solution processed transistors, because it is our opinion that scalable, roll-to-roll printing processing is one, if not the brightest, possible scenario for the future of organic electronics. With the exception of electrolyte-gated organic transistors, where impressively low width normalized resistances were reported (in the range of 10 Ω·cm), to date the lowest values reported for devices where the semiconductor is solution-processed and where the most common architectures are adopted, are ∼10 kΩ·cm for transistors with a field effect mobility in the 0.1-1 cm(2)/Vs range. Although these values represent the best case, they still pose a severe limitation for downscaling the channel lengths below a few micrometers, necessary for increasing the device switching speed. Moreover, techniques to lower contact resistances have been often developed on a case-by-case basis, depending on the materials, architecture and processing techniques. The lack of a standard strategy has hampered the progress of the field for a long time. Only recently, as the understanding of the rather complex physical processes at the metal/semiconductor interfaces has improved, more general approaches, with a validity that extends to several materials, are being proposed and successfully tested in the literature. Only a combined scientific and technological effort, on the one side to fully understand contact phenomena and on the other to completely master the tailoring of interfaces, will enable the development of advanced organic electronics applications and their widespread adoption in low-cost, large-area printed circuits.
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Entities:  

Mesh:

Substances:

Year:  2012        PMID: 22354535     DOI: 10.1002/adma.201104206

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  20 in total

1.  In situ generated hydrophobic micro ripples via π-π stacked pop-up reduced graphene oxide nanoflakes for extended critical heat flux and thermal conductivities.

Authors:  Ravi Kumar Cheedarala; Jung Il Song
Journal:  RSC Adv       Date:  2019-10-07       Impact factor: 4.036

2.  Ultrahigh mobility and efficient charge injection in monolayer organic thin-film transistors on boron nitride.

Authors:  Daowei He; Jingsi Qiao; Linglong Zhang; Junya Wang; Tu Lan; Jun Qian; Yun Li; Yi Shi; Yang Chai; Wei Lan; Luis K Ono; Yabing Qi; Jian-Bin Xu; Wei Ji; Xinran Wang
Journal:  Sci Adv       Date:  2017-09-06       Impact factor: 14.136

3.  Simultaneous Extraction of Density of States Width, Carrier Mobility and Injection Barriers in Organic Semiconductors.

Authors:  Pasquale Claudio Africa; Carlo de Falco; Francesco Maddalena; Mario Caironi; Dario Natali
Journal:  Sci Rep       Date:  2017-06-19       Impact factor: 4.379

4.  Simultaneous Improvement of Hole and Electron Injection in Organic Field-effect Transistors by Conjugated Polymer-wrapped Carbon Nanotube Interlayers.

Authors:  Seung-Hoon Lee; Dongyoon Khim; Yong Xu; Juhwan Kim; Won-Tae Park; Dong-Yu Kim; Yong-Young Noh
Journal:  Sci Rep       Date:  2015-05-22       Impact factor: 4.379

5.  Polymer-sorted semiconducting carbon nanotube networks for high-performance ambipolar field-effect transistors.

Authors:  Stefan P Schiessl; Nils Fröhlich; Martin Held; Florentina Gannott; Manuel Schweiger; Michael Forster; Ullrich Scherf; Jana Zaumseil
Journal:  ACS Appl Mater Interfaces       Date:  2014-12-19       Impact factor: 9.229

Review 6.  25th anniversary article: A soft future: from robots and sensor skin to energy harvesters.

Authors:  Siegfried Bauer; Simona Bauer-Gogonea; Ingrid Graz; Martin Kaltenbrunner; Christoph Keplinger; Reinhard Schwödiauer
Journal:  Adv Mater       Date:  2013-11-04       Impact factor: 30.849

7.  Ultra-high gain diffusion-driven organic transistor.

Authors:  Fabrizio Torricelli; Luigi Colalongo; Daniele Raiteri; Zsolt Miklós Kovács-Vajna; Eugenio Cantatore
Journal:  Nat Commun       Date:  2016-02-01       Impact factor: 14.919

8.  Switching from weakly to strongly limited injection in self-aligned, nano-patterned organic transistors.

Authors:  Karin Zojer; Thomas Rothländer; Johanna Kraxner; Roland Schmied; Ursula Palfinger; Harald Plank; Werner Grogger; Anja Haase; Herbert Gold; Barbara Stadlober
Journal:  Sci Rep       Date:  2016-09-27       Impact factor: 4.379

9.  Universal diffusion-limited injection and the hook effect in organic thin-film transistors.

Authors:  Chuan Liu; Gunel Huseynova; Yong Xu; Dang Xuan Long; Won-Tae Park; Xuying Liu; Takeo Minari; Yong-Young Noh
Journal:  Sci Rep       Date:  2016-07-21       Impact factor: 4.379

10.  Direct-written polymer field-effect transistors operating at 20 MHz.

Authors:  Andrea Perinot; Prakash Kshirsagar; Maria Ada Malvindi; Pier Paolo Pompa; Roberto Fiammengo; Mario Caironi
Journal:  Sci Rep       Date:  2016-12-12       Impact factor: 4.379

View more

北京卡尤迪生物科技股份有限公司 © 2022-2023.