Literature DB >> 22338682

Modular deposition chamber for in situ X-ray experiments during RF and DC magnetron sputtering.

Bärbel Krause1, Susan Darma, Marthe Kaufholz, Hans Hellmuth Gräfe, Sven Ulrich, Miguel Mantilla, Ralf Weigel, Steffen Rembold, Tilo Baumbach.   

Abstract

A new sputtering system for in situ X-ray experiments during DC and RF magnetron sputtering is described. The outstanding features of the system are the modular design of the vacuum chamber, the adjustable deposition angle, the option for plasma diagnostics, and the UHV sample transfer in order to access complementary surface analysis methods. First in situ diffraction and reflectivity measurements during RF and DC deposition of vanadium carbide demonstrate the performance of the set-up.

Entities:  

Year:  2012        PMID: 22338682     DOI: 10.1107/S0909049511052320

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  2 in total

1.  Monitoring the thin film formation during sputter deposition of vanadium carbide.

Authors:  Marthe Kaufholz; Bärbel Krause; Sunil Kotapati; Martin Köhl; Miguel F Mantilla; Michael Stüber; Sven Ulrich; Reinhard Schneider; Dagmar Gerthsen; Tilo Baumbach
Journal:  J Synchrotron Radiat       Date:  2015-01-01       Impact factor: 2.616

2.  In situ and real-time monitoring of structure formation during non-reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride.

Authors:  Bärbel Krause; Dmitry S Kuznetsov; Andrey E Yakshin; Shyjumon Ibrahimkutty; Tilo Baumbach; Fred Bijkerk
Journal:  J Appl Crystallogr       Date:  2018-06-28       Impact factor: 3.304

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.