| Literature DB >> 22287799 |
Elizabeth Squires-Wheeler1, Andrew E Skodol, Ulla Hilldoff Adamo, Anne S Bassett, George R Gewirtz, William G Honer, Barbara A Cornblatt, Simone A Roberts, L Erlenmeyer-Kimling.
Abstract
One hundred and seventy-five offspring of parents in two psychiatrically ill groups and of normal controls in the New York High-Risk Project (NYHRP) were assessed for Axis II personality traits and disorders as defined by the Diagnostic and Statistical Manual of Mental Disorders, Third Edition, Revised (DSM-III-R). These offspring include: subjects at high risk for schizophrenia (HRSz, n = 48), all of whom have a parent with schizophrenic disorder; subjects at high risk for affective disorder (HRAff, n = 40), all of whom have a parent with affective disorder; and subjects at no increased risk for psychiatric illness (NC, n = 87), whose parents are psychiatrically normal. The trained interviewers, who administered a standardized direct interview, were blind to parental clinical status and to previous clinical status of the offspring.The rates for any personality disorder (PD) ranged from 7% to 20%. Comorbidity between Axis I and Axis II disorders was high for all groups.Entities:
Year: 1993 PMID: 22287799 PMCID: PMC3266940 DOI: 10.1016/0022-3956(93)90065-a
Source DB: PubMed Journal: J Psychiatr Res ISSN: 0022-3956 Impact factor: 4.791