Literature DB >> 22238288

Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations.

S Fremy1, S Kawai, R Pawlak, T Glatzel, A Baratoff, E Meyer.   

Abstract

Three-dimensional dynamic force spectroscopy measurements were carried out above KBr(001) at low temperature in order to investigate the distance dependence of the tip-sample interactions. In particular, the recorded 3D frequency shift data as well as the extracted interaction force and potential energy fields were analysed with respect to influences of tip and/or sample deformations. We found that a postprocessing correction of the observed deformations significantly modifies the magnitude of the extracted interaction forces and also the image contrast.

Entities:  

Year:  2012        PMID: 22238288     DOI: 10.1088/0957-4484/23/5/055401

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  3 in total

1.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Authors:  Mehmet Z Baykara; Omur E Dagdeviren; Todd C Schwendemann; Harry Mönig; Eric I Altman; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2012-09-11       Impact factor: 3.649

2.  Dissipation signals due to lateral tip oscillations in FM-AFM.

Authors:  Michael Klocke; Dietrich E Wolf
Journal:  Beilstein J Nanotechnol       Date:  2014-11-10       Impact factor: 3.649

3.  Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

Authors:  Michael Klocke; Dietrich E Wolf
Journal:  Beilstein J Nanotechnol       Date:  2016-05-17       Impact factor: 3.649

  3 in total

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