Literature DB >> 22222632

Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field.

Bartosz Such1, Thilo Glatzel, Shigeki Kawai, Ernst Meyer, Robert Turanský, Ján Brndiar, Ivan Stich.   

Abstract

Non-contact atomic force microscopy is used to measure the 3D force field on a dense-packed Cu(111) surface. An unexpected image contrast reversal is observed as the tip is moved towards the surface, with atoms appearing first as bright spots, whereas hollow and bridge sites turn bright at smaller tip-sample distances. Computer modeling is used to elucidate the nature of the image contrast. We find that the contrast reversal is essentially a geometrical effect, which, unlike in gold, is observable in Cu due to an unusually large stability of the tip-sample junction over large distances.

Entities:  

Year:  2012        PMID: 22222632     DOI: 10.1088/0957-4484/23/4/045705

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  5 in total

1.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Authors:  Mehmet Z Baykara; Omur E Dagdeviren; Todd C Schwendemann; Harry Mönig; Eric I Altman; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2012-09-11       Impact factor: 3.649

2.  Structural development and energy dissipation in simulated silicon apices.

Authors:  Samuel Paul Jarvis; Lev Kantorovich; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2013-12-20       Impact factor: 3.649

3.  Real-space Wigner-Seitz cells imaging of potassium on graphite via elastic atomic manipulation.

Authors:  Feng Yin; Pekka Koskinen; Sampo Kulju; Jaakko Akola; Richard E Palmer
Journal:  Sci Rep       Date:  2015-02-05       Impact factor: 4.379

4.  Copper atomic-scale transistors.

Authors:  Fangqing Xie; Maryna N Kavalenka; Moritz Röger; Daniel Albrecht; Hendrik Hölscher; Jürgen Leuthold; Thomas Schimmel
Journal:  Beilstein J Nanotechnol       Date:  2017-03-01       Impact factor: 3.649

5.  Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.

Authors:  Adam Sweetman; Andrew Stannard
Journal:  Beilstein J Nanotechnol       Date:  2014-04-01       Impact factor: 3.649

  5 in total

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