Synchrotron-based spectroscopy of X-ray channeling through hollow capillary microchannels inside glass plates.

Here, soft X-ray synchrotron radiation transmitted through microchannel plates is studied experimentally. Fine structures of reflection and XANES Si L-edge spectra detected on the exit of silicon glass microcapillary structures under conditions of total X-ray reflection are presented and analyzed. The phenomenon of the interaction of channeling radiation with unoccupied electronic states and propagation of X-ray fluorescence excited in the microchannels is revealed. Investigations of the interaction of monochromatic radiation with the inner-shell capillary surface and propagation of fluorescence radiation through hollow glass capillary waveguides contribute to the development of novel X-ray focusing devices in the future.