Literature DB >> 22186641

The high-resolution diffraction beamline P08 at PETRA III.

O H Seeck1, C Deiter, K Pflaum, F Bertam, A Beerlink, H Franz, J Horbach, H Schulte-Schrepping, B M Murphy, M Greve, O Magnussen.   

Abstract

The new third-generation synchrotron radiation source PETRA III located at the Deutsches Elektronen-Synchrotron DESY in Hamburg, Germany, has been operational since the second half of 2009. PETRA III is designed to deliver hard X-ray beams with very high brilliance. As one of the first beamlines of PETRA III the high-resolution diffraction beamline P08 is fully operational. P08 is specialized in X-ray scattering and diffraction experiments on solids and liquids where extreme high resolution in reciprocal space is required. The resolving power results in the high-quality PETRA III beam and unique optical elements such as a large-offset monochromator and beryllium lens changers. A high-precision six-circle diffractometer for solid samples and a specially designed liquid diffractometer are installed in the experimental hutch. Regular users have been accepted since summer 2010.

Year:  2011        PMID: 22186641     DOI: 10.1107/S0909049511047236

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  8 in total

1.  In situ X-ray studies of adlayer-induced crystal nucleation at the liquid-liquid interface.

Authors:  Annika Elsen; Sven Festersen; Benjamin Runge; Christian T Koops; Benjamin M Ocko; Moshe Deutsch; Oliver H Seeck; Bridget M Murphy; Olaf M Magnussen
Journal:  Proc Natl Acad Sci U S A       Date:  2013-04-03       Impact factor: 11.205

2.  Lattice parameter accommodation between GaAs(111) nanowires and Si(111) substrate after growth via Au-assisted molecular beam epitaxy.

Authors:  Anton Davydok; Steffen Breuer; Andreas Biermanns; Lutz Geelhaar; Ullrich Pietsch
Journal:  Nanoscale Res Lett       Date:  2012-02-08       Impact factor: 4.703

3.  Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering.

Authors:  Alessandro Greco; Vladimir Starostin; Evelyn Edel; Valentin Munteanu; Nadine Rußegger; Ingrid Dax; Chen Shen; Florian Bertram; Alexander Hinderhofer; Alexander Gerlach; Frank Schreiber
Journal:  J Appl Crystallogr       Date:  2022-04-02       Impact factor: 3.304

4.  X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper.

Authors:  Oleg V Konovalov; Valentina Belova; Francesco La Porta; Mehdi Saedi; Irene M N Groot; Gilles Renaud; Irina Snigireva; Anatoly Snigirev; Maria Voevodina; Chen Shen; Andrea Sartori; Bridget M Murphy; Maciej Jankowski
Journal:  J Synchrotron Radiat       Date:  2022-04-01       Impact factor: 2.557

5.  Role of chemisorbing species in growth at liquid metal-electrolyte interfaces revealed by in situ X-ray scattering.

Authors:  Andrea Sartori; Rajendra P Giri; Hiromasa Fujii; Svenja C Hövelmann; Jonas E Warias; Philipp Jordt; Chen Shen; Bridget M Murphy; Olaf M Magnussen
Journal:  Nat Commun       Date:  2022-09-15       Impact factor: 17.694

6.  Influence of Oxygen Plasma on the Growth and Stability of Epitaxial NiCo2O4 Ultrathin Films on Various Substrates.

Authors:  Kevin Ruwisch; Andreas Alexander; Tobias Pollenske; Karsten Küpper; Joachim Wollschläger
Journal:  Materials (Basel)       Date:  2022-10-05       Impact factor: 3.748

7.  Density dependent composition of InAs quantum dots extracted from grazing incidence x-ray diffraction measurements.

Authors:  Manjula Sharma; Milan K Sanyal; Ian Farrer; David A Ritchie; Arka B Dey; Arpan Bhattacharyya; Oliver H Seeck; Joanna Skiba-Szymanska; Martin Felle; Anthony J Bennett; Andrew J Shields
Journal:  Sci Rep       Date:  2015-10-28       Impact factor: 4.379

8.  Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments.

Authors:  Ali Al Hassan; Jonas Lähnemann; Arman Davtyan; Mahmoud Al-Humaidi; Jesús Herranz; Danial Bahrami; Taseer Anjum; Florian Bertram; Arka Bikash Dey; Lutz Geelhaar; Ullrich Pietsch
Journal:  J Synchrotron Radiat       Date:  2020-08-12       Impact factor: 2.616

  8 in total

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