| Literature DB >> 22183927 |
Benjamin J Blaiszik1, Sharlotte L B Kramer, Martha E Grady, David A McIlroy, Jeffrey S Moore, Nancy R Sottos, Scott R White.
Abstract
Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium-indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).Entities:
Keywords: electrical conductivity; microelectronics; self-healing materials; stimuli-responsive materials
Mesh:
Year: 2011 PMID: 22183927 DOI: 10.1002/adma.201102888
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849