| Literature DB >> 22154388 |
A T Abdul Rahman1, R P Hugtenburg, Siti Fairus Abdul Sani, A I M Alalawi, Fatma Issa, R Thomas, M A Barry, A Nisbet, D A Bradley.
Abstract
We investigate the ability of high spatial resolution (∼120 μm) Ge-doped SiO2 TL dosimeters to measure photoelectron dose enhancement resulting from the use of a moderate to high-Z target (an iodinated contrast media) irradiated by 90 kVp X-rays. We imagine its application in a novel radiation synovectomy technique, modelled by a phantom containing a reservoir of I2 molecules at the interface of which the doped silica dosimeters are located. Measurements outside of the iodine photoelectron range are provided for using a stepped-design that allows insertion of the fibres within the phantom. Monte Carlo simulation (MCNPX) is used for verification. At the phantom medium I2-interface additional photoelectron generation is observed, ∼60% above that in the absence of the I2, simulations providing agreement to within 3%. Percentage depth doses measured away from the iodine contrast medium reservoir are bounded by published PDDs at 80 kVp and 100 kVp.Entities:
Year: 2011 PMID: 22154388 DOI: 10.1016/j.apradiso.2011.11.030
Source DB: PubMed Journal: Appl Radiat Isot ISSN: 0969-8043 Impact factor: 1.513