Irradiance-based emissivity correction in infrared thermography for electronic applications.

This work analyzes, discusses, and proposes a solution to the problem of the emissivity correction present in infrared thermography when coatings with known emissivity cannot be deposited on the inspected surface. It is shown that the conventional technique based on two reference thermal images and the linearization of the blackbody radiation dependence on temperature is not a reliable and accurate solution when compared with the coating procedure. In this scenario, a new approach based on the direct processing of the output signal of the infrared camera (which is proportional to the detected irradiance) is proposed to obtain an accurate emissivity and surrounding reflections map, perfectly compensating the thermal maps. The results obtained have been validated using a module as a test vehicle containing two thermal test chips which incorporate embedded temperature sensors.