| Literature DB >> 22105844 |
Ping-Hua Xiang1, Shutaro Asanuma, Hiroyuki Yamada, Isao H Inoue, Hiroshi Sato, Hiroshi Akoh, Akihito Sawa, Kazunori Ueno, Hongtao Yuan, Hidekazu Shimotani, Masashi Kawasaki, Yoshihiro Iwasa.
Abstract
A prototype Mott transistor, the electric double layer transistor with a strained CaMnO(3) thin film, is fabricated. As predicted by the strain phase diagram of electron-doped manganite films, the device with the compressively strained CaMnO(3) exhibits an immense conductivity modulation upon applying a tiny gate voltage of 2 V.Entities:
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Year: 2011 PMID: 22105844 DOI: 10.1002/adma.201102968
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849