Literature DB >> 22088442

Thermal diffuse scattering in transmission electron microscopy.

B D Forbes1, A J D'Alfonso, S D Findlay, D Van Dyck, J M Lebeau, S Stemmer, L J Allen.   

Abstract

In conventional transmission electron microscopy, thermal scattering significantly affects the image contrast. It has been suggested that not accounting for this correctly is the main cause of the Stobbs factor, the ubiquitous, large contrast mismatch found between theory and experiment. In the case where a hard aperture is applied, we show that previous conclusions drawn from work using bright field scanning transmission electron microscopy and invoking the principle of reciprocity are reliable in the presence of thermal scattering. In the aperture-free case it has been suggested that even the most sophisticated mathematical models for thermal diffuse scattering lack in their numerical implementation, specifically that there may be issues in sampling, including that of the contrast transfer function of the objective lens. We show that these concerns can be satisfactorily overcome with modest computing resources; thermal scattering can be modelled accurately enough for the purpose of making quantitative comparison between simulation and experiment. Spatial incoherence of the source is also investigated. Neglect or inadequate handling of thermal scattering in simulation can have an appreciable effect on the predicted contrast and can be a significant contribution to the Stobbs factor problem.
Copyright © 2011 Elsevier B.V. All rights reserved.

Year:  2011        PMID: 22088442     DOI: 10.1016/j.ultramic.2011.09.017

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Dark-field transmission electron microscopy and the Debye-Waller factor of graphene.

Authors:  Brian Shevitski; Matthew Mecklenburg; William A Hubbard; E R White; Ben Dawson; M S Lodge; Masa Ishigami; B C Regan
Journal:  Phys Rev B Condens Matter Mater Phys       Date:  2013-01-15

2.  Computational insights and the observation of SiC nanograin assembly: towards 2D silicon carbide.

Authors:  Toma Susi; Viera Skákalová; Andreas Mittelberger; Peter Kotrusz; Martin Hulman; Timothy J Pennycook; Clemens Mangler; Jani Kotakoski; Jannik C Meyer
Journal:  Sci Rep       Date:  2017-06-30       Impact factor: 4.379

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.