| Literature DB >> 22085532 |
Rosa Córdoba1, Rodrigo Fernández-Pacheco, Amalio Fernández-Pacheco, Alexandre Gloter, César Magén, Odile Stéphan, Manuel Ricardo Ibarra, José María De Teresa.
Abstract
Nanolithography techniques in a scanning electron microscope/focused ion beam are very attractive tools for a number of synthetic processes, including the fabrication of ferromagnetic nano-objects, with potential applications in magnetic storage or magnetic sensing. One of the most versatile techniques is the focused electron beam induced deposition, an efficient method for the production of magnetic structures highly resolved at the nanometric scale. In this work, this method has been applied to the controlled growth of magnetic nanostructures using Co2(CO)8. The chemical and structural properties of these deposits have been studied by electron energy loss spectroscopy and high-resolution transmission electron microscopy at the nanometric scale. The obtained results allow us to correlate the chemical and structural properties with the functionality of these magnetic nanostructures.Entities:
Year: 2011 PMID: 22085532 PMCID: PMC3237113 DOI: 10.1186/1556-276X-6-592
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1HRTEM image and FFT (inset) of deposit 1.
Figure 2O K edge (532 eV) spectra collected through the SiO. The spectra were collected for deposits 1 (a) and 2 (b). As the probe scans through the SiO2 substrate, the interface between both materials, and finally the inner part of the deposit, the O K edge changes its shape (apparition of a small pre-peak, pointed with an arrow), practically disappearing at the inside of the microstructure for deposit 2.
Figure 3Comparison of the EELS spectra. Comparison of the EELS spectra of the Co L2,3 edge (at an energy of 779 eV) for deposits 1 and 2, and references for metallic cobalt and cobalt (II).
Figure 4HRTEM image and FFT (inset) of deposit 2.
The preparation conditions for the samples and quantitative ratio between oxygen and cobalt
| Deposit | O/Co | |||
|---|---|---|---|---|
| 1 | 30 | 0.044 | 0.85 | 0.27 |
| 2 | 30 | 2.400 | 0.04 | 0.30 |
Summary of growth parameters, beam energy (Ve) and current (Ie), EELS quantification ratio between oxygen and cobalt and the average L2/L3 intensity ratios in Co L2,3 edge (see text for details).
Figure 5Reference image and profiles of relative concentration. (a) STEM-HAADF reference image of deposit 2. (b) Profiles of relative concentration of the O/Co and L2/L3 intensity ratios along the growth direction (blue line).