Literature DB >> 22065427

Anatomy of a nanoscale conduction channel reveals the mechanism of a high-performance memristor.

Feng Miao1, John Paul Strachan, J Joshua Yang, Min-Xian Zhang, Ilan Goldfarb, Antonio C Torrezan, Peter Eschbach, Ronald D Kelley, Gilberto Medeiros-Ribeiro, R Stanley Williams.   

Abstract

By employing a precise method for locating and directly imaging the active switching region in a resistive random access memory (RRAM) device, a nanoscale conducting channel consisting of an amorphous Ta(O) solid solution surrounded by nearly stoichiometric Ta(2) O(5) is observed. Structural and chemical analysis of the channel combined with temperature-dependent transport measurements indicate a unique resistance switching mechanism.
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Year:  2011        PMID: 22065427     DOI: 10.1002/adma.201103379

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  19 in total

1.  Memristive devices for computing.

Authors:  J Joshua Yang; Dmitri B Strukov; Duncan R Stewart
Journal:  Nat Nanotechnol       Date:  2013-01       Impact factor: 39.213

2.  Mechanical Behaviors of the Origami-Inspired Horseshoe-Shaped Solar Arrays.

Authors:  Zhi Li; Chengguo Yu; Luqiao Qi; Shichao Xing; Yan Shi; Cunfa Gao
Journal:  Micromachines (Basel)       Date:  2022-05-02       Impact factor: 3.523

3.  Anatomy of vertical heteroepitaxial interfaces reveals the memristive mechanism in Nb₂O₅-NaNbO₃ thin films.

Authors:  Linglong Li; Lu Lu; Zhiguang Wang; Yanxi Li; Yonggang Yao; Dawei Zhang; Guang Yang; Jianjun Yao; Dwight Viehland; Yaodong Yang
Journal:  Sci Rep       Date:  2015-03-18       Impact factor: 4.379

4.  Spectromicroscopic insights for rational design of redox-based memristive devices.

Authors:  Christoph Baeumer; Christoph Schmitz; Amr H H Ramadan; Hongchu Du; Katharina Skaja; Vitaliy Feyer; Philipp Müller; Benedikt Arndt; Chun-Lin Jia; Joachim Mayer; Roger A De Souza; Claus Michael Schneider; Rainer Waser; Regina Dittmann
Journal:  Nat Commun       Date:  2015-10-19       Impact factor: 14.919

5.  Thermoelectric Seebeck effect in oxide-based resistive switching memory.

Authors:  Ming Wang; Chong Bi; Ling Li; Shibing Long; Qi Liu; Hangbing Lv; Nianduan Lu; Pengxiao Sun; Ming Liu
Journal:  Nat Commun       Date:  2014-08-20       Impact factor: 14.919

6.  Voltage divider effect for the improvement of variability and endurance of TaO(x) memristor.

Authors:  Kyung Min Kim; J Joshua Yang; John Paul Strachan; Emmanuelle Merced Grafals; Ning Ge; Noraica Davila Melendez; Zhiyong Li; R Stanley Williams
Journal:  Sci Rep       Date:  2016-02-02       Impact factor: 4.379

7.  Dynamic-load-enabled ultra-low power multiple-state RRAM devices.

Authors:  Xiang Yang; I-Wei Chen
Journal:  Sci Rep       Date:  2012-10-17       Impact factor: 4.379

8.  Direct evidence on Ta-Metal Phases Igniting Resistive Switching in TaO(x) Thin Film.

Authors:  Min Kyu Yang; Hyunsu Ju; Gun Hwan Kim; Jeon-Kook Lee; Han-Cheol Ryu
Journal:  Sci Rep       Date:  2015-09-14       Impact factor: 4.379

9.  Quantized conductance coincides with state instability and excess noise in tantalum oxide memristors.

Authors:  Wei Yi; Sergey E Savel'ev; Gilberto Medeiros-Ribeiro; Feng Miao; M-X Zhang; J Joshua Yang; Alexander M Bratkovsky; R Stanley Williams
Journal:  Nat Commun       Date:  2016-04-04       Impact factor: 14.919

10.  Memory window engineering of Ta2O5-x oxide-based resistive switches via incorporation of various insulating frames.

Authors:  Ah Rahm Lee; Gwang Ho Baek; Tae Yoon Kim; Won Bae Ko; Seung Mo Yang; Jongmin Kim; Hyun Sik Im; Jin Pyo Hong
Journal:  Sci Rep       Date:  2016-07-25       Impact factor: 4.379

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