Literature DB >> 22050515

Binary Pt-Si nanostructures prepared by focused electron-beam-induced deposition.

Marcel Winhold1, Christian H Schwalb, Fabrizio Porrati, Roland Sachser, Achilleas S Frangakis, Britta Kämpken, Andreas Terfort, Norbert Auner, Michael Huth.   

Abstract

Binary systems of Pt-Si are prepared by electron-beam-induced deposition using the two precursors, trimethyl(methylcyclopentadienyl)platinum(IV) (MeCpPt(Me)(3)) and neopentasilane (Si(SiH(3))(4)), simultaneously. By varying the relative flux of the two precursors during deposition, we are able to study composites containing platinum and silicon in different ratios by means of energy-dispersive X-ray spectroscopy, atomic force microscopy, electrical transport measurements, and transmission electron microscopy. The results show strong evidence for the formation of a binary, metastable Pt(2)Si(3) phase, leading to a maximum in the conductivity for a Si/Pt ratio of 3:2.

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Year:  2011        PMID： 22050515     DOI： 10.1021/nn203134a

Source DB:  PubMed          Journal:  ACS Nano        ISSN： 1936-0851            Impact factor:   15.881


  9 in total

1.  Focused electron beam induced deposition: A perspective.

Authors:  Michael Huth; Fabrizio Porrati; Christian Schwalb; Marcel Winhold; Roland Sachser; Maja Dukic; Jonathan Adams; Georg Fantner
Journal:  Beilstein J Nanotechnol       Date:  2012-08-29       Impact factor: 3.649

2.  Directed deposition of silicon nanowires using neopentasilane as precursor and gold as catalyst.

Authors:  Britta Kämpken; Verena Wulf; Norbert Auner; Marcel Winhold; Michael Huth; Daniel Rhinow; Andreas Terfort
Journal:  Beilstein J Nanotechnol       Date:  2012-07-25       Impact factor: 3.649

Review 3.  Continuum models of focused electron beam induced processing.

Authors:  Milos Toth; Charlene Lobo; Vinzenz Friedli; Aleksandra Szkudlarek; Ivo Utke
Journal:  Beilstein J Nanotechnol       Date:  2015-07-14       Impact factor: 3.649

4.  3D Nanoprinting via laser-assisted electron beam induced deposition: growth kinetics, enhanced purity, and electrical resistivity.

Authors:  Brett B Lewis; Robert Winkler; Xiahan Sang; Pushpa R Pudasaini; Michael G Stanford; Harald Plank; Raymond R Unocic; Jason D Fowlkes; Philip D Rack
Journal:  Beilstein J Nanotechnol       Date:  2017-04-07       Impact factor: 3.649

5.  Electron interactions with the heteronuclear carbonyl precursor H2FeRu3(CO)13 and comparison with HFeCo3(CO)12: from fundamental gas phase and surface science studies to focused electron beam induced deposition.

Authors:  Ragesh Kumar T P; Paul Weirich; Lukas Hrachowina; Marc Hanefeld; Ragnar Bjornsson; Helgi Rafn Hrodmarsson; Sven Barth; D Howard Fairbrother; Michael Huth; Oddur Ingólfsson
Journal:  Beilstein J Nanotechnol       Date:  2018-02-14       Impact factor: 3.649

6.  Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM.

Authors:  Xiaoxing Ke; Carla Bittencourt; Sara Bals; Gustaaf Van Tendeloo
Journal:  Beilstein J Nanotechnol       Date:  2013-02-04       Impact factor: 3.649

7.  In situ growth optimization in focused electron-beam induced deposition.

Authors:  Paul M Weirich; Marcel Winhold; Christian H Schwalb; Michael Huth
Journal:  Beilstein J Nanotechnol       Date:  2013-12-17       Impact factor: 3.649

8.  Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition.

Authors:  Federico Venturi; Gian Carlo Gazzadi; Amir H Tavabi; Alberto Rota; Rafal E Dunin-Borkowski; Stefano Frabboni
Journal:  Beilstein J Nanotechnol       Date:  2018-04-03       Impact factor: 3.649

Review 9.  Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review.

Authors:  Harald Plank; Robert Winkler; Christian H Schwalb; Johanna Hütner; Jason D Fowlkes; Philip D Rack; Ivo Utke; Michael Huth
Journal:  Micromachines (Basel)       Date:  2019-12-30       Impact factor: 2.891
  9 in total

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