| Literature DB >> 22003470 |
Volker Walhorn1, Jan Paskarbeit, Heinrich Gotthard Frey, Alexander Harder, Dario Anselmetti.
Abstract
In fluorescence microscopy and spectroscopy, energy transfer processes between single fluorophores and fluorophore quencher pairs play an important role in the investigation of molecular distances or orientations. At distances larger than about 3 nm these effects originate predominantly from dipolar coupling. As these experiments are commonly performed in homogenous media, effects at the interface boundaries can be neglected. Nevertheless, the combination of such assays with single-molecule manipulation techniques such as atomic force microscopy (AFM) requires a detailed understanding of the influence of interfaces on dipolar coupling effects. In the presented work we used a combined total internal reflection fluorescence microscopy (TIRFM)-AFM setup to elucidate this issue. We measured the fluorescence emission emanating from single quantum dots as a function of distance from the apex of a gold-coated cantilever tip. As well as fluorescence quenching at close proximity to the tip, we found a nonlinear and nonmonotonic distance dependence of the fluorescence emission. To confirm and interpret our findings we performed calculations on the basis of a simplified multiple multipole (MMP) approach, which successfully supports our experimental data. Moreover, we revealed and quantified the influence of interfering processes such as field enhancement confined at interface boundaries, mirror dipoles and (resonant) dipolar coupling.Entities:
Keywords: AFM; fluorescence energy transfer; multiple multipole simulation; quantum dots
Year: 2011 PMID: 22003470 PMCID: PMC3190634 DOI: 10.3762/bjnano.2.68
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1a) Schematic image of the combined TIRFM–AFM setup. The AFM is placed on top of an inverted microscope. The subnanometer spatial resolution of the AFM piezo drive allows precise positioning relative to the sample surface. The incident laser is directed towards the sample surface at an angle of total reflection. The intensity of the evanescent wave projecting beyond the cover slip decreases exponentially. An image-intensified CCD camera detects the fluorescence light. b) Single CCD camera frame of a single quantum dot.
Figure 2Integrated fluorescence intensity of a single quantum dot as a function of tip distance. The bin size is 7.5 nm (3 × step size of 2.5 nm).
Figure 3Separated contributions to the external control of fluorescence emission, for several different tip shapes. a) Relative excitation rate Γexc (inset: semilog plot) at an illumination angle of 45°. b) Relative quantum yield calculated for constant excitation.
Figure 4a) Distribution of the field intensity |E|2 near an evanescently illuminated gold tip 35 nm above an air–glass interface. b) Field intensity |E|2 along the symmetry axis.
Figure 5Relative emission rate for several surface distances and tip opening angles estimated by the observable fluorescence emission intensity I.
Figure 6Logarithmic field distribution of a single dipole emitter perpendicular to a glass–air interface for tip distances of a) 200 nm and b) 5 nm. The tip opening angle is 18°. The microscope objective lens detection angle (red) illustrates the change in the angular emission pattern at different tip distances. The direction of highest emission intensity (arrows) shifts to larger angles at smaller tip distances.
Figure 7Detection efficiency of an objective lens (numerical aperture (NA) = 1.45) as a function of tip distance.