Literature DB >> 21999681

Quantitative measurement with scanning thermal microscope by preventing the distortion due to the heat transfer through the air.

Kyeongtae Kim1, Jaehun Chung, Gwangseok Hwang, Ohmyoung Kwon, Joon Sik Lee.   

Abstract

Because of its high spatial resolution, scanning thermal microscopy (SThM) has been developed quite actively and applied in such diverse areas as microelectronics, optoelectronics, polymers, and carbon nanotubes for more than a decade since the 1990s. However, despite its long history and diverse areas of application, surprisingly, no quantitative profiling method has been established yet. This is mostly due to the nonlocal nature of measurement by conventional SThM: the signal measured by SThM is induced not only from the local heat flux through the tip-sample thermal contact but also (and mostly) from the heat flux through the air gap between the sample and the SThM probe. In this study, a rigorous but simple and practical theory for quantitative SThM for local measurement is established and verified experimentally using high-performance SThM probes. The development of quantitative SThM will make possible new breakthroughs in diverse fields of nanothermal science and engineering.
© 2011 American Chemical Society

Entities:  

Year:  2011        PMID: 21999681     DOI: 10.1021/nn2026325

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  4 in total

1.  NaYF4:Er3+,Yb3+/SiO2 Core/Shell Upconverting Nanocrystals for Luminescence Thermometry up to 900 K.

Authors:  Robin G Geitenbeek; P Tim Prins; Wiebke Albrecht; Alfons van Blaaderen; Bert M Weckhuysen; Andries Meijerink
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2017-01-20       Impact factor: 4.126

Review 2.  Heat Transport Control and Thermal Characterization of Low-Dimensional Materials: A Review.

Authors:  Alexandros El Sachat; Francesc Alzina; Clivia M Sotomayor Torres; Emigdio Chavez-Angel
Journal:  Nanomaterials (Basel)       Date:  2021-01-13       Impact factor: 5.076

3.  Direct measurement of nanoscale filamentary hot spots in resistive memory devices.

Authors:  Sanchit Deshmukh; Miguel Muñoz Rojo; Eilam Yalon; Sam Vaziri; Cagil Koroglu; Raisul Islam; Ricardo A Iglesias; Krishna Saraswat; Eric Pop
Journal:  Sci Adv       Date:  2022-03-30       Impact factor: 14.136

4.  AFM-thermoreflectance for simultaneous measurements of the topography and temperature.

Authors:  Jinsung Rho; Mikyung Lim; Seung S Lee; Bong Jae Lee
Journal:  RSC Adv       Date:  2018-08-02       Impact factor: 3.361

  4 in total

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