Literature DB >> 21975584

Quantitative analysis of nanoparticle growth through plasmonics.

Rémi Lazzari1, Jacques Jupille.   

Abstract

Plasmon excitation appears to be a powerful and flexible tool for probing in situ and in real time the growth of supported conducting metal nanoparticles. However, although models exist for analysing optical profiles, limitations arise in the realistic modelling of particle shape from the lack of knowledge of temperature effects and of broadening sources. This paper reports on the growth of silver on alumina at 190-675 K monitored by surface differential reflectivity spectroscopy in the UV-visible range. In the framework of plasmonic response analysis, particles are modelled by truncated spheres. Their polarizabilities are computed within the quasi-static approximation and used as an input to the interface susceptibilities model in order to determine the Fresnel reflection coefficient. The pivotal importance of the thermal variation of the metal dielectric constant is demonstrated. Finite-size effects are accounted for. As size distribution fluctuations contribute marginally to the lineshape compared to the aspect ratio (diameter/height) distribution, a convolution method for representing the experimental broadening is introduced. Effects of disorder on the lineshape are discussed. It is highlighted that beside the quality of the fit (not a proof by itself!), physical meaning of the parameters related to the sticking probability, growth and wetting is crucially required for validating models. The proposed modelling opens interesting perspectives for the quantitative study of growth via plasmonics, in particular in the case of noble metals.

Entities:  

Year:  2011        PMID: 21975584     DOI: 10.1088/0957-4484/22/44/445703

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  2 in total

1.  Influence of size, shape and core-shell interface on surface plasmon resonance in Ag and Ag@MgO nanoparticle films deposited on Si/SiO x.

Authors:  Sergio D'Addato; Daniele Pinotti; Maria Chiara Spadaro; Guido Paolicelli; Vincenzo Grillo; Sergio Valeri; Luca Pasquali; Luca Bergamini; Stefano Corni
Journal:  Beilstein J Nanotechnol       Date:  2015-02-09       Impact factor: 3.649

Review 2.  In Situ and Real-Time Nanoscale Monitoring of Ultra-Thin Metal Film Growth Using Optical and Electrical Diagnostic Tools.

Authors:  Jonathan Colin; Andreas Jamnig; Clarisse Furgeaud; Anny Michel; Nikolaos Pliatsikas; Kostas Sarakinos; Gregory Abadias
Journal:  Nanomaterials (Basel)       Date:  2020-11-09       Impact factor: 5.076

  2 in total

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