A broadband ferromagnetic resonance spectrometer to measure thin films up to 70 GHz.

We report the development of a broadband ferromagnetic resonance (FMR) system operating in the frequency range from 10 MHz to 70 GHz using a closed-cycle He refrigeration system for measurements of thin films and micron/nano structures. The system is capable of carrying out measurements in frequency and field domain. Using two coplanar waveguides, it is capable of simultaneously measuring two samples in the out of plane and in plane FMR geometries. The system operates in the temperature range of 27-350 K and is sensitive to less than one atomic monolayer of a single crystal Fe film.