| Literature DB >> 21934868 |
Hanfei Yan1, Volker Rose, Deming Shu, Enju Lima, Hyon Chol Kang, Ray Conley, Chian Liu, Nima Jahedi, Albert T Macrander, G Brian Stephenson, Martin Holt, Yong S Chu, Ming Lu, Jörg Maser.
Abstract
Hard x-ray microscopy with nanometer resolution will open frontiers in the study of materials and devices, environmental sciences, and life sciences by utilizing the unique characterization capabilities of x-rays. Here we report two-dimensional nanofocusing by multilayer Laue lenses (MLLs), a type of diffractive optics that is in principle capable of focusing x-rays to 1 nm. We demonstrate focusing to a 25 × 27 nm(2) FWHM spot with an efficiency of 2% at a photon energy of 12 keV, and to a 25 × 40 nm(2) FWHM spot with an efficiency of 17% at a photon energy of 19.5 keV.Entities:
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Year: 2011 PMID: 21934868 DOI: 10.1364/OE.19.015069
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894