Literature DB >> 21934868

Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses.

Hanfei Yan1, Volker Rose, Deming Shu, Enju Lima, Hyon Chol Kang, Ray Conley, Chian Liu, Nima Jahedi, Albert T Macrander, G Brian Stephenson, Martin Holt, Yong S Chu, Ming Lu, Jörg Maser.   

Abstract

Hard x-ray microscopy with nanometer resolution will open frontiers in the study of materials and devices, environmental sciences, and life sciences by utilizing the unique characterization capabilities of x-rays. Here we report two-dimensional nanofocusing by multilayer Laue lenses (MLLs), a type of diffractive optics that is in principle capable of focusing x-rays to 1 nm. We demonstrate focusing to a 25 × 27 nm(2) FWHM spot with an efficiency of 2% at a photon energy of 12 keV, and to a 25 × 40 nm(2) FWHM spot with an efficiency of 17% at a photon energy of 19.5 keV.

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Year:  2011        PMID: 21934868     DOI: 10.1364/OE.19.015069

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  7 in total

1.  Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses.

Authors:  Hanfei Yan; Yong S Chu; Jörg Maser; Evgeny Nazaretski; Jungdae Kim; Hyon Chol Kang; Jeffrey J Lombardo; Wilson K S Chiu
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

2.  Sub-10 nm beam confinement by X-ray waveguides: design, fabrication and characterization of optical properties.

Authors:  S P Krüger; H Neubauer; M Bartels; S Kalbfleisch; K Giewekemeyer; P J Wilbrandt; M Sprung; T Salditt
Journal:  J Synchrotron Radiat       Date:  2012-01-06       Impact factor: 2.616

3.  11 nm hard X-ray focus from a large-aperture multilayer Laue lens.

Authors:  Xiaojing Huang; Hanfei Yan; Evgeny Nazaretski; Raymond Conley; Nathalie Bouet; Juan Zhou; Kenneth Lauer; Li Li; Daejin Eom; Daniel Legnini; Ross Harder; Ian K Robinson; Yong S Chu
Journal:  Sci Rep       Date:  2013-12-20       Impact factor: 4.379

4.  Hard X-ray nanofocusing at low-emittance synchrotron radiation sources.

Authors:  Christian G Schroer; Gerald Falkenberg
Journal:  J Synchrotron Radiat       Date:  2014-08-29       Impact factor: 2.616

5.  Imaging trace element distributions in single organelles and subcellular features.

Authors:  Yoav Kashiv; Jotham R Austin; Barry Lai; Volker Rose; Stefan Vogt; Malek El-Muayed
Journal:  Sci Rep       Date:  2016-02-25       Impact factor: 4.379

6.  Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling.

Authors:  Marcel Mayer; Kahraman Keskinbora; Corinne Grévent; Adriana Szeghalmi; Mato Knez; Markus Weigand; Anatoly Snigirev; Irina Snigireva; Gisela Schütz
Journal:  J Synchrotron Radiat       Date:  2013-04-09       Impact factor: 2.616

7.  A hard X-ray nanoprobe beamline for nanoscale microscopy.

Authors:  Robert P Winarski; Martin V Holt; Volker Rose; Peter Fuesz; Dean Carbaugh; Christa Benson; Deming Shu; David Kline; G Brian Stephenson; Ian McNulty; Jörg Maser
Journal:  J Synchrotron Radiat       Date:  2012-09-05       Impact factor: 2.616

  7 in total

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