| Literature DB >> 21902430 |
M Hinterstein1, J Rouquette, J Haines, Ph Papet, M Knapp, J Glaum, H Fuess.
Abstract
An in situ structural description of the origin of the ferroelectric properties as a function of the applied electric field E was obtained by synchrotron x-ray diffraction. A setup was used to average the effects of the preferred orientation induced by the strong piezoelectric strain and solve in situ the crystal structure as a function of the applied electric field. Hence, we were able to describe the microscopic origin of the macroscopic ferro- and piezoelectric properties of the most widely used ferroelectric material, lead zirconate titanate.Entities:
Year: 2011 PMID: 21902430 DOI: 10.1103/PhysRevLett.107.077602
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161