| Literature DB >> 21886201 |
Nathan Curry1, Pierre Bondareff, Mathieu Leclercq, Niek F van Hulst, Riccardo Sapienza, Sylvain Gigan, Samuel Grésillon.
Abstract
We present a simple scheme to determine the diffusion properties of a thin slab of strongly scattering material by measuring the speckle contrast resulting from the transmission of a femtosecond pulse with controlled bandwidth. In contrast with previous methods, our scheme does not require time measurements nor interferometry. It is well adapted to the characterization of samples for pulse shaping, nonlinear excitation through scattering media, and biological imaging.Year: 2011 PMID: 21886201 DOI: 10.1364/OL.36.003332
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776