Literature DB >> 21869962

Measuring Si-C60 chemical forces via single molecule spectroscopy.

Cristina Chiutu1, Andrew Stannard, Adam M Sweetman, Philip Moriarty.   

Abstract

We measure the short-range chemical force between a silicon-terminated tip and individual adsorbed C(60) molecules using frequency modulation atomic force microscopy. The interaction with an adsorbed fullerene is sufficiently strong to drive significant atomic rearrangement of tip structures. This journal is © The Royal Society of Chemistry 2011

Entities:  

Year:  2011        PMID： 21869962     DOI： 10.1039/c1cc14147c

Source DB:  PubMed          Journal:  Chem Commun (Camb)        ISSN： 1359-7345            Impact factor:   6.222


  3 in total

1.  Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.

Authors:  Fabien Castanié; Laurent Nony; Sébastien Gauthier; Xavier Bouju
Journal:  Beilstein J Nanotechnol       Date:  2012-04-02       Impact factor: 3.649

2.  Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor.

Authors:  Julian Stirling; Gordon A Shaw
Journal:  Beilstein J Nanotechnol       Date:  2013-01-08       Impact factor: 3.649

3.  Switching molecular orientation of individual fullerene at room temperature.

Authors:  Lacheng Liu; Shuyi Liu; Xiu Chen; Chao Li; Jie Ling; Xiaoqing Liu; Yingxiang Cai; Li Wang
Journal:  Sci Rep       Date:  2013-10-28       Impact factor: 4.379
  3 in total

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