High-resolution digital holography utilized by the subpixel sampling method.

A novel (to our knowledge) approach for resolution improvement in digital holography is presented in this paper. The proposed method is based on recording the incoming interference field on a complementary metal-oxide semiconductor (CMOS) camera with subpixel resolution. The method takes advantage of the small pixel size of the CMOS sensor, while overcoming the reduced fill factor. This paper describes the experimental and numerical procedures. The improvement of the obtainable optical resolution, image quality, and phase measurement accuracy are demonstrated within this paper.