Literature DB >> 21836995

Bis(furan-2-ylcarbon-yl) diselenide.

David B Cordes1, Guoxiong Hua, Alexandra M Z Slawin, J Derek Woollins.   

Abstract

The title mol-ecule, C(10)H(6)O(4)Se(2), lies on a twofold rotation axis. The Se-Se bond length of 2.305 (3) Å is similar to that in diphenyl diselenide [2.3066 (7) and 2.3073 (10) Å for the P and M isomers, respectively] and longer than that in 1,8-diseleno-naph-thalene [2.0879 (8) Å]. The mol-ecule adopts a gauche conformation with respect to the C=O groups.

Entities:  

Year:  2011        PMID: 21836995      PMCID: PMC3152040          DOI: 10.1107/S160053681102085X

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For background information and the structure of diphenyl diselenide, see: Fuller et al. (2010 ▶). For the structure of 1,8-diselenona­phthalene, see: Aucott et al. (2004 ▶).

Experimental

Crystal data

C10H6O4Se2 M = 348.07 Orthorhombic, a = 9.615 (8) Å b = 14.132 (14) Å c = 3.991 (4) Å V = 542.4 (9) Å3 Z = 2 Mo Kα radiation μ = 6.81 mm−1 T = 125 K 0.18 × 0.12 × 0.03 mm

Data collection

Rigaku Saturn70 diffractometer Absorption correction: multi-scan (REQAB; Rigaku, 1998 ▶) T min = 0.384, T max = 0.815 1716 measured reflections 895 independent reflections 873 reflections with F 2 > 2σ(F 2) R int = 0.057

Refinement

R[F 2 > 2σ(F 2)] = 0.050 wR(F 2) = 0.131 S = 1.09 895 reflections 73 parameters H-atom parameters constrained Δρmax = 1.63 e Å−3 Δρmin = −2.07 e Å−3 Absolute structure: Flack (1983 ▶), 322 Friedel pairs Flack parameter: 0.03 (5) Data collection: CrystalClear (Rigaku, 2009 ▶); cell refinement: CrystalClear; data reduction: CrystalClear; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: CrystalStructure (Rigaku, 2010 ▶); software used to prepare material for publication: CrystalStructure. Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S160053681102085X/lh5259sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S160053681102085X/lh5259Isup2.hkl Supplementary material file. DOI: 10.1107/S160053681102085X/lh5259Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C10H6O4Se2F(000) = 332.00
Mr = 348.07Dx = 2.131 Mg m3
Orthorhombic, P21212Mo Kα radiation, λ = 0.71075 Å
Hall symbol: P 2 2abCell parameters from 1723 reflections
a = 9.615 (8) Åθ = 2.1–26.4°
b = 14.132 (14) ŵ = 6.81 mm1
c = 3.991 (4) ÅT = 125 K
V = 542.4 (9) Å3Prism, colourless
Z = 20.18 × 0.12 × 0.03 mm
Rigaku Saturn70 diffractometer873 reflections with F2 > 2σ(F2)
Detector resolution: 14.629 pixels mm-1Rint = 0.057
ω scansθmax = 25.0°
Absorption correction: multi-scan (REQAB; Rigaku, 1998)h = −9→11
Tmin = 0.384, Tmax = 0.815k = −12→16
1716 measured reflectionsl = −4→4
895 independent reflections
Refinement on F2Hydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.050H-atom parameters constrained
wR(F2) = 0.131w = 1/[σ2(Fo2) + (0.0809P)2 + 2.1662P] where P = (Fo2 + 2Fc2)/3
S = 1.09(Δ/σ)max < 0.001
895 reflectionsΔρmax = 1.63 e Å3
73 parametersΔρmin = −2.07 e Å3
0 restraintsAbsolute structure: Flack (1983), 322 Friedel pairs
Primary atom site location: structure-invariant direct methodsFlack parameter: 0.03 (5)
Secondary atom site location: difference Fourier map
Geometry. ENTER SPECIAL DETAILS OF THE MOLECULAR GEOMETRY
Refinement. Refinement was performed using all reflections. The weighted R-factor (wR) and goodness of fit (S) are based on F2. R-factor (gt) are based on F. The threshold expression of F2 > 2.0 σ(F2) is used only for calculating R-factor (gt).
xyzUiso*/Ueq
Se(1)−0.03886 (8)0.42284 (5)−0.0428 (2)0.0223 (4)
O(1)0.2214 (7)0.4163 (5)0.2824 (18)0.0307 (15)
O(3)−0.0133 (6)0.2267 (4)0.1408 (17)0.0245 (14)
C(1)0.1221 (8)0.3698 (6)0.202 (3)0.0220 (19)
C(2)0.1076 (9)0.2689 (6)0.257 (3)0.0221 (18)
C(4)−0.0020 (10)0.1321 (6)0.230 (3)0.029 (3)
C(5)0.1174 (9)0.1177 (6)0.407 (3)0.030 (2)
C(6)0.1870 (9)0.2064 (6)0.420 (3)0.029 (2)
H(4)−0.06770.08430.17540.0354*
H(5)0.14810.05980.50260.0358*
H(6)0.27370.21900.52510.0346*
U11U22U33U12U13U23
Se(1)0.0186 (5)0.0255 (5)0.0228 (5)−0.0008 (4)−0.0037 (4)−0.0008 (4)
O(1)0.019 (3)0.029 (3)0.044 (4)−0.003 (3)−0.004 (3)−0.003 (4)
O(3)0.017 (3)0.023 (3)0.033 (4)−0.002 (3)0.000 (3)0.001 (3)
C(1)0.011 (4)0.039 (5)0.016 (5)0.002 (4)−0.002 (4)−0.006 (4)
C(2)0.016 (4)0.031 (4)0.019 (5)0.001 (4)0.006 (4)−0.008 (4)
C(4)0.030 (5)0.021 (4)0.038 (6)−0.004 (4)0.004 (4)−0.002 (4)
C(5)0.024 (4)0.025 (4)0.041 (6)0.007 (4)0.003 (5)0.006 (5)
C(6)0.011 (4)0.039 (5)0.037 (6)0.007 (4)−0.007 (4)−0.004 (5)
Se(1)—Se(1)i2.305 (3)C(2)—C(6)1.337 (13)
Se(1)—C(1)1.977 (9)C(4)—C(5)1.363 (14)
O(1)—C(1)1.203 (11)C(5)—C(6)1.422 (12)
O(3)—C(2)1.386 (11)C(4)—H(4)0.950
O(3)—C(4)1.388 (10)C(5)—H(5)0.950
C(1)—C(2)1.449 (12)C(6)—H(6)0.950
Se(1)i—Se(1)—C(1)96.0 (3)C(4)—C(5)—C(6)106.5 (8)
C(2)—O(3)—C(4)105.3 (7)C(2)—C(6)—C(5)107.2 (8)
Se(1)—C(1)—O(1)123.1 (7)O(3)—C(4)—H(4)125.009
Se(1)—C(1)—C(2)111.9 (6)C(5)—C(4)—H(4)125.002
O(1)—C(1)—C(2)125.0 (8)C(4)—C(5)—H(5)126.736
O(3)—C(2)—C(1)117.0 (8)C(6)—C(5)—H(5)126.737
O(3)—C(2)—C(6)110.9 (8)C(2)—C(6)—H(6)126.404
C(1)—C(2)—C(6)132.0 (9)C(5)—C(6)—H(6)126.395
O(3)—C(4)—C(5)110.0 (8)
Se(1)i—Se(1)—C(1)—O(1)−3.6 (7)Se(1)—C(1)—C(2)—C(6)−176.7 (7)
Se(1)i—Se(1)—C(1)—C(2)178.9 (5)O(1)—C(1)—C(2)—O(3)−178.8 (8)
C(1)—Se(1)—Se(1)i—C(1)i−120.5 (3)O(1)—C(1)—C(2)—C(6)5.7 (16)
C(2)—O(3)—C(4)—C(5)2.9 (10)O(3)—C(2)—C(6)—C(5)1.3 (11)
C(4)—O(3)—C(2)—C(1)−178.9 (7)C(1)—C(2)—C(6)—C(5)176.9 (9)
C(4)—O(3)—C(2)—C(6)−2.5 (9)O(3)—C(4)—C(5)—C(6)−2.1 (11)
Se(1)—C(1)—C(2)—O(3)−1.3 (10)C(4)—C(5)—C(6)—C(2)0.5 (11)
  2 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  Automated chemical crystallography.

Authors:  Amy L Fuller; Lindesay A S Scott-Hayward; Yang Li; Michael Bühl; Alexandra M Z Slawin; J Derek Woollins
Journal:  J Am Chem Soc       Date:  2010-04-28       Impact factor: 15.419

  2 in total

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