Literature DB >> 21836268

Self-similarity and finite-size effects in nano-indentation of highly cross-linked polymers.

T Altebaeumer1, B Gotsmann, A Knoll, G Cherubini, U Duerig.   

Abstract

The scalability of thermomechanical polymer deformations in the sub-10 nm regime is of particular importance for nano-imprint techniques, hardness measurements of thin films by nano-indentations, and scanning-probe-based thermomechanical data storage. We investigate nano-indentation in the sub-10 nm regime performed on highly cross-linked polymer films of different thicknesses. It is shown that the lateral and vertical geometric characteristics of the indents independently scale down to an indent depth of 1 nm and that the scaling parameters are functions of the film thickness and the temperature of the indenter. However, in the limit of shallow indents the scaling of the cross-coupling between lateral and vertical dimensions is lost. It is argued that the breakdown of self-similarity is due to a minimum strain requirement originating from the co-operative nature of the polymer response induced by α transitions which lock the indent in the deformed state. The results shed new light on the fundamental processes and size effects involved in nanoscale plastic replication, in general.

Entities:  

Year:  2008        PMID: 21836268     DOI: 10.1088/0957-4484/19/47/475301

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography.

Authors:  Yu Kyoung Ryu Cho; Colin D Rawlings; Heiko Wolf; Martin Spieser; Samuel Bisig; Steffen Reidt; Marilyne Sousa; Subarna R Khanal; Tevis D B Jacobs; Armin W Knoll
Journal:  ACS Nano       Date:  2017-11-01       Impact factor: 15.881

  1 in total

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