| Literature DB >> 21832589 |
Donghyuk Yeom1, Jeongmin Kang, Myoungwon Lee, Jaewon Jang, Junggwon Yun, Dong-Young Jeong, Changjoon Yoon, Jamin Koo, Sangsig Kim.
Abstract
The memory characteristics of ZnO nanowire-based nano-floating gate memory (NFGM) with Pt nanocrystals acting as the floating gate nodes were investigated in this work. Pt nanocrystals were embedded between Al(2)O(3) tunneling and control oxide layers deposited on ZnO nanowire channels. For a representative ZnO nanowire-based NFGM with embedded Pt nanocrystals, a threshold voltage shift of 3.8 V was observed in its drain current versus gate voltage (I(DS)-V(GS)) measurements for a double sweep of the gate voltage, revealing that the deep effective potential wells built into the nanocrystals provide our NFGM with a large charge storage capacity. Details of the charge storage effect observed in this memory device are discussed in this paper.Entities:
Year: 2008 PMID: 21832589 DOI: 10.1088/0957-4484/19/39/395204
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874