Literature DB >> 21832558

Inverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy.

Shuiqing Hu1, Arvind Raman.   

Abstract

Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging, manipulation and spectroscopy using the AFM. In this paper we present a general theory for the reconstruction of tip-sample interaction forces using integral equations for AM-AFM and Chebyshev polynomial expansions. This allows us to reconstruct the tip-sample interactions using standard amplitude and phase versus distance curves acquired in AM-AFM regardless of tip oscillation amplitude and in both the net attractive and repulsive regimes of oscillation. Systematic experiments are performed to reconstruct interaction forces on polymer samples to demonstrate the power of the theoretical approach.

Entities:  

Year:  2008        PMID: 21832558     DOI: 10.1088/0957-4484/19/37/375704

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  9 in total

1.  Interaction imaging with amplitude-dependence force spectroscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

Review 2.  Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy.

Authors:  Sergio Santos; Albert Verdaguer
Journal:  Materials (Basel)       Date:  2016-03-09       Impact factor: 3.623

3.  Hydration Dynamics and the Future of Small-Amplitude AFM Imaging in Air.

Authors:  Sergio Santos; Tuza A Olukan; Chia-Yun Lai; Matteo Chiesa
Journal:  Molecules       Date:  2021-11-23       Impact factor: 4.411

4.  Quantifying nanoscale forces using machine learning in dynamic atomic force microscopy.

Authors:  Abhilash Chandrashekar; Pierpaolo Belardinelli; Miguel A Bessa; Urs Staufer; Farbod Alijani
Journal:  Nanoscale Adv       Date:  2022-04-05

5.  Interpreting motion and force for narrow-band intermodulation atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-01-21       Impact factor: 3.649

6.  Polynomial force approximations and multifrequency atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-06-10       Impact factor: 3.649

7.  Unlocking higher harmonics in atomic force microscopy with gentle interactions.

Authors:  Sergio Santos; Victor Barcons; Josep Font; Albert Verdaguer
Journal:  Beilstein J Nanotechnol       Date:  2014-03-11       Impact factor: 3.649

8.  Peak forces and lateral resolution in amplitude modulation force microscopy in liquid.

Authors:  Horacio V Guzman; Ricardo Garcia
Journal:  Beilstein J Nanotechnol       Date:  2013-12-06       Impact factor: 3.649

9.  Generalized Hertz model for bimodal nanomechanical mapping.

Authors:  Aleksander Labuda; Marta Kocuń; Waiman Meinhold; Deron Walters; Roger Proksch
Journal:  Beilstein J Nanotechnol       Date:  2016-07-05       Impact factor: 3.649

  9 in total

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