| Literature DB >> 21828574 |
L F Zagonel1, M Bäurer, A Bailly, O Renault, M Hoffmann, S-J Shih, D Cockayne, N Barrett.
Abstract
We have used energy-filtered x-ray photoelectron emission microscopy (XPEEM) and synchrotron radiation to measure the grain orientation dependence of the work function of a sintered niobium-doped strontium titanate ceramic. A significant spread in work function values is found. Grain orientation and surface reducing/oxidizing conditions are the main factors in determining the work function. Energy-filtered XPEEM looks ideally suited for analysis of other technologically interesting polycrystalline samples.Entities:
Year: 2009 PMID: 21828574 DOI: 10.1088/0953-8984/21/31/314013
Source DB: PubMed Journal: J Phys Condens Matter ISSN: 0953-8984 Impact factor: 2.333