The role of an amorphous carbon layer on a multi-wall carbon nanotube attached atomic force microscope tip in making good electrical contact to a gold electrode.

Multi-wall carbon nanotube (MWNT) attached atomic force microscope (AFM) tips (MWNT tips) have good potential for use in AFM lithography. Good conducting MWNT tips are needed in such applications. However, characterizing the conductance of MWNT tips is nontrivial: making a good electrical contact between the MWNT and electrode is difficult. We observed that MWNT tips produced by hydrocarbon-deposition attachment usually do not make good electrical contacts to gold electrodes because of the thin and rough amorphous carbon layer on the MWNT that was unintentionally deposited during the attachment. We found that good contacts can be made if a more amorphous carbon layer is deposited to form a thick and smooth amorphous carbon layer on MWNTs. Good contact was made either by transformation of the amorphous carbon layer into a conducting or peel-off layer, exposing the bare MWNT surface. MWNT tips with an exposed MWNT surface showed the well-known high-current-flowing capacity and the stepped-cutting behavior of bare MWNTs. The peeling-off behavior of a thick amorphous carbon layer may be utilized in producing bare-surfaced MWNT tips that have good conductance and therefore are useful for applications.