Literature DB >> 21825361

Temperature-dependent EXAFS analysis of embedded Pt nanocrystals.

R Giulian1, L L Araujo, P Kluth, D J Sprouster, C S Schnohr, G J Foran, M C Ridgway.   

Abstract

The vibrational and thermal properties of embedded Pt nanocrystals (NCs) have been investigated with temperature-dependent extended x-ray absorption fine structure (EXAFS) spectroscopy. NCs of diameter 1.8-7.4 nm produced by ion implantation in amorphous SiO(2) were analysed over the temperature range 20-295 K. An increase in Einstein temperature (∼194 K) relative to that of a Pt standard (∼179 K) was evident for the smallest NCs while those larger than ∼2.0 nm exhibited values comparable to bulk material. Similarly, the thermal expansion of interatomic distances was lowest for small NCs. While the amorphous SiO(2) matrix restricted the thermal expansion of interatomic distances, it did not have a significant influence on the mean vibrational frequency of embedded Pt NCs. Instead, the latter was governed by finite-size effects or, specifically, capillary pressure.

Entities:  

Year:  2009        PMID: 21825361     DOI: 10.1088/0953-8984/21/15/155302

Source DB:  PubMed          Journal:  J Phys Condens Matter        ISSN: 0953-8984            Impact factor:   2.333


  1 in total

1.  An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation.

Authors:  G Maity; S Dubey; Anter El-Azab; R Singhal; S Ojha; P K Kulriya; S Dhar; T Som; D Kanjilal; Shiv P Patel
Journal:  RSC Adv       Date:  2020-01-27       Impact factor: 4.036

  1 in total

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