| Literature DB >> 21817744 |
Chun Lan1, Pornsak Srisungsitthisunti, Placidus B Amama, Timothy S Fisher, Xianfan Xu, Ronald G Reifenberger.
Abstract
A technique of measuring contact resistance between an individual nanotube and a deposited metallic film is described. Using laser ablation to sequentially shorten the contact length between a nanotube and the evaporated metallic film, the linear resistivity of the nanotube as well as the specific contact resistivity between the nanotube and metallic film can be determined. This technique can be generally used to measure the specific contact resistance that develops between a metallic film and a variety of different nanowires and nanotubes.Entities:
Year: 2008 PMID: 21817744 DOI: 10.1088/0957-4484/19/12/125703
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874