Literature DB >> 21817744

Measurement of metal/carbon nanotube contact resistance by adjusting contact length using laser ablation.

Chun Lan1, Pornsak Srisungsitthisunti, Placidus B Amama, Timothy S Fisher, Xianfan Xu, Ronald G Reifenberger.   

Abstract

A technique of measuring contact resistance between an individual nanotube and a deposited metallic film is described. Using laser ablation to sequentially shorten the contact length between a nanotube and the evaporated metallic film, the linear resistivity of the nanotube as well as the specific contact resistivity between the nanotube and metallic film can be determined. This technique can be generally used to measure the specific contact resistance that develops between a metallic film and a variety of different nanowires and nanotubes.

Entities:  

Year:  2008        PMID: 21817744     DOI: 10.1088/0957-4484/19/12/125703

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  8 in total

1.  Nanoscale Joule heating, Peltier cooling and current crowding at graphene-metal contacts.

Authors:  Kyle L Grosse; Myung-Ho Bae; Feifei Lian; Eric Pop; William P King
Journal:  Nat Nanotechnol       Date:  2011-04-03       Impact factor: 39.213

2.  Length scaling of carbon nanotube transistors.

Authors:  Aaron D Franklin; Zhihong Chen
Journal:  Nat Nanotechnol       Date:  2010-11-21       Impact factor: 39.213

3.  Characterization of contact resistances in ceramic-coated vertically aligned carbon nanotube arrays.

Authors:  Meng Li; Ning Yang; Vanessa Wood; Hyung Gyu Park
Journal:  RSC Adv       Date:  2019-03-04       Impact factor: 4.036

4.  Electrical conductivity studies on individual conjugated polymer nanowires: two-probe and four-probe results.

Authors:  Yunze Long; Jeanluc Duvail; Mengmeng Li; Changzhi Gu; Zongwen Liu; Simon P Ringer
Journal:  Nanoscale Res Lett       Date:  2009-11-13       Impact factor: 4.703

5.  Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy.

Authors:  Maguy Dominiczak; Larissa Otubo; David Alamarguy; Frédéric Houzé; Sebastian Volz; Sophie Noël; Jinbo Bai
Journal:  Nanoscale Res Lett       Date:  2011-04-14       Impact factor: 4.703

6.  A Two Dimensional Tunneling Resistance Transmission Line Model for Nanoscale Parallel Electrical Contacts.

Authors:  Sneha Banerjee; John Luginsland; Peng Zhang
Journal:  Sci Rep       Date:  2019-10-09       Impact factor: 4.379

7.  Electrical Conductivity of Multiwall Carbon Nanotube Bundles Contacting with Metal Electrodes by Nano Manipulators inside SEM.

Authors:  Quan Yang; Li Ma; Shungen Xiao; Dongxing Zhang; Aristide Djoulde; Maosheng Ye; Yini Lin; Songchao Geng; Xuan Li; Tao Chen; Lining Sun
Journal:  Nanomaterials (Basel)       Date:  2021-05-13       Impact factor: 5.076

8.  Characterization of the Resistance and Force of a Carbon Nanotube/Metal Side Contact by Nanomanipulation.

Authors:  Ning Yu; Masahiro Nakajima; Qing Shi; Zhan Yang; Huaping Wang; Lining Sun; Qiang Huang; Toshio Fukuda
Journal:  Scanning       Date:  2017-02-13       Impact factor: 1.932

  8 in total

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