| Literature DB >> 21805626 |
Andres Castellanos-Gomez1, Magdalena Wojtaszek, Nikolaos Tombros, Nicolás Agraït, Bart J van Wees, Gabino Rubio-Bollinger.
Abstract
By mechanical exfoliation, it is possible to deposit atomically thin mica flakes down to single-monolayer thickness on SiO2/Si wafers. The optical contrast of these mica flakes on top of a SiO2/Si substrate depends on their thickness, the illumination wavelength, and the SiO2 substrate thickness, and can be quantitatively accounted for by a Fresnel-law-based model. The preparation of atomically thin insulating crystalline sheets will enable the fabrication of ultrathin, defect-free insulating substrates, dielectric barriers, or planar electron-tunneling junctions. Additionally, it is shown that few-layer graphene flakes can be deposited on top of a previously transferred mica flake. Our transfer method relies on viscoelastic stamps, as used for soft lithography. A Raman spectroscopy study shows that such an all-dry deposition technique yields cleaner and higher-quality flakes than conventional wet-transfer procedures based on lithographic resists.Entities:
Keywords: atomically thin mica; graphene transfer; mechanical exfoliation; optical contrast; soft lithography
Year: 2011 PMID: 21805626 DOI: 10.1002/smll.201100733
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281