| Literature DB >> 21794158 |
Tae-Eon Park1, Ki-Young Lee, Ilsoo Kim, Joonyeon Chang, Peter Voorhees, Heon-Jin Choi.
Abstract
Silicon nanoribbons (Si NRs) with a thickness of about 30 nm and a width up to a few micrometers were synthesized. Systematic observations indicate that Si NRs evolve via the following sequences: the growth of basal nanowires assisted with a Pt catalyst by a vapor-liquid-solid (VLS) mechanism, followed by the formation of saw-like edges on the basal nanowires and the planar filling of those edges by a vapor-solid (VS) mechanism. Si NRs have twins along the longitudinal < 110 > growth of the basal nanowires that also extend in < 112 > direction to edge of NRs. These twins appear to drive the lateral growth by a reentrant twin mechanism. These twins also create a mirror-like crystallographic configuration in the anisotropic surface energy state and appear to further drive lateral saw-like edge growth in the < 112 > direction. These outcomes indicate that the Si NRs are grown by a combination of the two mechanisms of a Pt-catalyst-assisted VLS mechanism for longitudinal growth and a twin-assisted VS mechanism for lateral growth.Entities:
Year: 2011 PMID: 21794158 PMCID: PMC3211989 DOI: 10.1186/1556-276X-6-476
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1SEM image of Si NRs. (a) Typical SEM image of Si NRs grown on a Si substrate. (b) SEM images of an individual Si NR.
Figure 2TEM images of NR. (a-e) TEM images showing the evolutionary stages of the NR; basal nanowire, saw-like edges on the basal nanowire, and the NR.
Figure 3HRTEM images of NRs. (a) HRTEM images showing the crystallographic orientation of the nanowire with saw-like edges in the course of the conversion to the NRs. The inset at the top shows interface between the basal nanowire and saw-like edge. The inset at the bottom shows the basal nanowire. The scale bar in the images is 5 nm. Corresponding SAED pattern recorded along the [-111] zone axis (b) and EDS spectrum (c).
Figure 4Cross-sectional TEM and HRTEM images of NR. (a) Cross-sectional TEM image of the saw-like edged NR. (b-d) Cross-sectional HRTEM images of the three regions (the end part of the saw-like edge, the middle part of the saw-like edge, and the part of the basal nanowire) indicated in panel (a). The insets of (b-d) show diffractograms of the Si region in the box in each part. These indicate that the basal nanowire was grown along < 110 > direction and that the Si nanosaw/NR is bi-crystalline containing a single {111} twin. (e) Schematic diagram of the projected shape and facets of the basal nanowire part. (f) Schematic showing the formation of the Si NR.