Literature DB >> 21753972

Poly[μ-(5,5'-diazenediylditetra-zolido)-dicaesium].

Yan Meng1.   

Abstract

The asymmetric unit of the title compound, [Cs(2)(C(2)N(10))](n), comprises a Cs(+) cation, and one-half of a 5,5'-diazenediylditetra-zolide anion. The Cs(+) cation is six-coordinated by N atoms from six 5,5'-diazenediylditetra-zolide ligands. Each 5,5'-diazenediylditetra-zolide ligand is surrounded by 12 Cs(+) cations, coordinating through ten N atoms. The Cs(+) cations are arranged in a chain along the a-axis direction with a CsCs separation of 4.4393 (10) Å. Such coordination leads to the formation of the three-dimensional framework.

Entities:  

Year:  2011        PMID: 21753972      PMCID: PMC3099978          DOI: 10.1107/S1600536811008312

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For applications of 5,5′-diazenediylditetra­zolide salts, see: Hammerl et al. (2001 ▶). For the synthesis of sodium 5,5′-diazenediylditetra­zolide, see: Thiele (1892 ▶). For the synthesis and characterization of alkali and alkaline earth metal salts of 5,5′-diazenediylditetra­zolide, see: Hammerl et al. (2002 ▶); Steinhauser et al. (2009 ▶). For Cs—N bond lengths, see: Ebespächer et al. (2009 ▶).

Experimental

Crystal data

[Cs2(C2N10)] M = 429.94 Monoclinic, a = 4.4393 (9) Å b = 8.7151 (17) Å c = 11.860 (2) Å β = 93.83 (3)° V = 457.82 (16) Å3 Z = 2 Mo Kα radiation μ = 7.94 mm−1 T = 293 K 0.42 × 0.26 × 0.07 mm

Data collection

Bruker SMART CCD diffractometer Absorption correction: multi-scan (SADABS; Bruker, 2007 ▶) T min = 0.135, T max = 0.606 4146 measured reflections 842 independent reflections 747 reflections with I > 2σ(I) R int = 0.047

Refinement

R[F 2 > 2σ(F 2)] = 0.031 wR(F 2) = 0.082 S = 1.15 842 reflections 64 parameters Δρmax = 1.36 e Å−3 Δρmin = −1.47 e Å−3 Data collection: SMART (Bruker, 2007 ▶); cell refinement: SAINT (Bruker, 2007 ▶); data reduction: SAINT; program(s) used to solve structure: SHELXTL (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXTL; molecular graphics: SHELXTL; software used to prepare material for publication: publCIF (Westrip, 2010 ▶). Crystal structure: contains datablocks I, global. DOI: 10.1107/S1600536811008312/nk2085sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536811008312/nk2085Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
[Cs2(C2N10)]F(000) = 384
Mr = 429.94Dx = 3.119 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybcCell parameters from 1601 reflections
a = 4.4393 (9) Åθ = 3.4–25.4°
b = 8.7151 (17) ŵ = 7.94 mm1
c = 11.860 (2) ÅT = 293 K
β = 93.83 (3)°Block, yellow
V = 457.82 (16) Å30.42 × 0.26 × 0.07 mm
Z = 2
Bruker SMART CCD diffractometer842 independent reflections
Radiation source: fine-focus sealed tube747 reflections with I > 2σ(I)
graphiteRint = 0.047
φ and ω scansθmax = 25.3°, θmin = 3.4°
Absorption correction: multi-scan (SADABS; Bruker, 2007)h = −5→4
Tmin = 0.135, Tmax = 0.606k = −10→10
4146 measured reflectionsl = −12→14
Refinement on F20 restraints
Least-squares matrix: fullPrimary atom site location: structure-invariant direct methods
R[F2 > 2σ(F2)] = 0.031Secondary atom site location: difference Fourier map
wR(F2) = 0.082w = 1/[σ2(Fo2) + (0.0385P)2 + 0.5977P] where P = (Fo2 + 2Fc2)/3
S = 1.15(Δ/σ)max < 0.001
842 reflectionsΔρmax = 1.36 e Å3
64 parametersΔρmin = −1.46 e Å3
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
Cs10.08959 (8)0.47092 (5)0.19017 (3)0.0345 (2)
C1−0.2743 (12)0.3536 (7)0.4829 (5)0.0246 (13)
N1−0.3813 (11)0.3517 (6)0.3756 (4)0.0320 (12)
N2−0.5901 (11)0.2386 (6)0.3729 (5)0.0346 (13)
N3−0.6023 (13)0.1805 (6)0.4744 (5)0.0389 (14)
N4−0.4029 (13)0.2515 (7)0.5477 (5)0.0379 (14)
N5−0.0545 (11)0.4536 (6)0.5334 (5)0.0293 (12)
U11U22U33U12U13U23
Cs10.0288 (3)0.0391 (3)0.0354 (3)−0.00007 (16)0.0014 (2)0.00540 (17)
C10.022 (3)0.026 (3)0.026 (3)0.005 (3)0.001 (2)−0.001 (3)
N10.028 (3)0.035 (3)0.032 (3)−0.004 (2)−0.001 (2)−0.007 (3)
N20.026 (3)0.034 (3)0.043 (3)−0.002 (2)0.001 (2)−0.009 (3)
N30.031 (3)0.029 (3)0.057 (4)0.003 (2)0.004 (3)0.008 (3)
N40.031 (3)0.040 (3)0.042 (3)0.001 (3)0.001 (3)0.009 (3)
N50.025 (3)0.032 (3)0.031 (3)0.002 (2)0.003 (2)−0.003 (2)
Cs1—N2i3.225 (6)N1—N21.352 (7)
Cs1—N3ii3.260 (6)N2—N31.311 (8)
Cs1—N2iii3.270 (5)N2—Cs1vi3.225 (6)
Cs1—N4iv3.301 (6)N2—Cs1vii3.270 (5)
Cs1—N13.301 (5)N2—Cs1viii3.341 (5)
Cs1—N2v3.341 (5)N3—N41.349 (8)
C1—N11.329 (7)N3—Cs1ix3.260 (6)
C1—N41.329 (8)N4—Cs1x3.301 (6)
C1—N51.411 (8)N5—N5xi1.252 (10)
N2i—Cs1—N3ii94.82 (14)N4—C1—N5118.7 (5)
N2i—Cs1—N2iii149.65 (5)C1—N1—N2103.4 (5)
N3ii—Cs1—N2iii115.02 (14)C1—N1—Cs1115.6 (4)
N3ii—Cs1—N1i94.53 (14)N2—N1—Cs1132.6 (4)
N2iii—Cs1—N1i145.48 (14)N3—N2—N1109.3 (5)
N2i—Cs1—N4iv102.85 (14)N3—N2—Cs1vi144.7 (4)
N3ii—Cs1—N4iv70.05 (14)N1—N2—Cs1vi80.2 (3)
N2iii—Cs1—N4iv83.47 (14)N3—N2—Cs1vii82.3 (4)
N2i—Cs1—N168.00 (13)N1—N2—Cs1vii168.2 (4)
N3ii—Cs1—N1135.48 (14)N3—N2—Cs1viii90.3 (4)
N2iii—Cs1—N185.81 (13)N1—N2—Cs1viii92.8 (3)
N4iv—Cs1—N174.28 (13)N2—N3—N4110.4 (5)
N2i—Cs1—N2v108.58 (7)N2—N3—Cs1ix157.3 (4)
N3ii—Cs1—N2v77.69 (14)N4—N3—Cs1ix88.4 (4)
N2iii—Cs1—N2v84.36 (13)C1—N4—N3102.9 (5)
N4iv—Cs1—N2v136.31 (13)C1—N4—Cs1x113.2 (4)
N1—Cs1—N2v146.00 (14)N3—N4—Cs1x116.4 (4)
N1—C1—N4113.9 (5)N5xi—N5—C1114.6 (7)
N1—C1—N5127.4 (6)
  2 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  [N(2)H(5)](+)(2)[N(4)C-N=N-CN(4)](2-): a new high-nitrogen high-energetic material.

Authors:  A Hammerl; T M Klapötke; H Nöth; M Warchhold; G Holl; M Kaiser; U Ticmanis
Journal:  Inorg Chem       Date:  2001-07-02       Impact factor: 5.165

  2 in total

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