Literature DB >> 21741918

High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy.

S Hata1, H Miyazaki, S Miyazaki, M Mitsuhara, M Tanaka, K Kaneko, K Higashida, K Ikeda, H Nakashima, S Matsumura, J S Barnard, J H Sharp, P A Midgley.   

Abstract

Electron tomography requires a wide angular range of specimen-tilt for a reliable three-dimensional (3D) reconstruction. Although specimen holders are commercially available for tomography, they have several limitations, including tilting capability in only one or two axes at most, e.g. tilt-rotate. For amorphous specimens, the image contrast depends on mass and thickness only and the single-tilt holder is adequate for most tomographic image acquisitions. On the other hand, for crystalline materials where image contrast is strongly dependent on diffraction conditions, current commercially available tomography holders are inadequate, because they lack tilt capability in all three orthogonal axes needed to maintain a constant diffraction condition over the whole tilt range. We have developed a high-angle triple-axis (HATA) tomography specimen holder capable of high-angle tilting for the primary horizontal axis with tilting capability in the other (orthogonal) horizontal and vertical axes. This allows the user to trim the specimen tilt to obtain the desired diffraction condition over the whole tilt range of the tomography series. To demonstrate its capabilities, we have used this triple-axis tomography holder with a dual-axis tilt series (the specimen was rotated by 90° ex-situ between series) to obtain tomographic reconstructions of dislocation arrangements in plastically deformed austenitic steel foils.
Copyright © 2011 Elsevier B.V. All rights reserved.

Entities:  

Year:  2011        PMID: 21741918     DOI: 10.1016/j.ultramic.2011.03.021

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  4 in total

1.  Electron tomography imaging methods with diffraction contrast for materials research.

Authors:  Satoshi Hata; Hiromitsu Furukawa; Takashi Gondo; Daisuke Hirakami; Noritaka Horii; Ken-Ichi Ikeda; Katsumi Kawamoto; Kosuke Kimura; Syo Matsumura; Masatoshi Mitsuhara; Hiroya Miyazaki; Shinsuke Miyazaki; Mitsu Mitsuhiro Murayama; Hideharu Nakashima; Hikaru Saito; Masashi Sakamoto; Shigeto Yamasaki
Journal:  Microscopy (Oxf)       Date:  2020-05-21       Impact factor: 1.571

2.  Tilt-less 3-D electron imaging and reconstruction of complex curvilinear structures.

Authors:  Emad Oveisi; Antoine Letouzey; Duncan T L Alexander; Quentin Jeangros; Robin Schäublin; Guillaume Lucas; Pascal Fua; Cécile Hébert
Journal:  Sci Rep       Date:  2017-09-06       Impact factor: 4.379

3.  Three-Dimensional Imaging of Dislocations in a Ti-35mass%Nb Alloy by Electron Tomography.

Authors:  Kazuhisa Sato; Satoshi Semboshi; Toyohiko J Konno
Journal:  Materials (Basel)       Date:  2015-04-21       Impact factor: 3.623

4.  Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy.

Authors:  Shiro Ihara; Hikaru Saito; Mizumo Yoshinaga; Lavakumar Avala; Mitsuhiro Murayama
Journal:  Sci Rep       Date:  2022-08-05       Impact factor: 4.996

  4 in total

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