Literature DB >> 21730416

Gate voltage dependent characteristics of p-n diodes and bipolar transistors based on multiwall CN(x)/carbon nanotube intramolecular junctions.

W J Zhang1, Q F Zhang, Y Chai, X Shen, J L Wu.   

Abstract

The electrical transport characteristics of multiwall CN(x)/carbon nanotube intramolecular junctions were studied. The junctions could be used as diodes. We found that the rectification resulted from p-n junctions, not from metal-semiconductor junctions. The gate effect was very weak when the diodes were reverse biased. At forward bias, however, some of the p-n diodes could be n-type transistors. Experimental results supported the opinion that the gate voltage dependent property is derived from the Schottky barrier between the CN(x) part and the electrode. Using p-n diodes, a bipolar transistor with nanoscale components was built, whose behavior was very similar to that of a conventional planar bipolar transistor.

Entities:  

Year:  2007        PMID: 21730416     DOI: 10.1088/0957-4484/18/39/395205

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  O2 Plasma Etching and Antistatic Gun Surface Modifications for CNT Yarn Microelectrode Improve Sensitivity and Antifouling Properties.

Authors:  Cheng Yang; Ying Wang; Christopher B Jacobs; Ilia N Ivanov; B Jill Venton
Journal:  Anal Chem       Date:  2017-04-28       Impact factor: 6.986

  1 in total

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