Literature DB >> 21727407

Kelvin probe force microscopy on surfaces of UHV cleaved ionic crystals.

Clemens Barth, Claude R Henry.   

Abstract

Force spectroscopy and Kelvin probe force microscopy (KPFM) measurements taken on (001) surfaces of UHV cleaved NaCl, KCl and MgO are presented for the first time. With the help of force spectroscopy we show first that the charging of (001) surfaces of alkali halide crystals, which generally occurs after UHV cleavage, vanishes after a couple of days due to their sufficiently high ionic conductivity at room temperature. KPFM images of these (001) surfaces show that the surface potential is not uniform but exhibits variations of up to 1 V at a nanometre length scale. Variations on terraces as well as a strong contrast at step edges can be observed, of which the latter is probably due to trapped charges. On MgO(001), we observe strong changes in the surface potential, especially at previously reported adstructures. These changes explain why imaging MgO(001) is difficult.

Entities:  

Year:  2006        PMID: 21727407     DOI: 10.1088/0957-4484/17/7/S09

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  4 in total

1.  Study of high-low KPFM on a pn-patterned Si surface.

Authors:  Ryo Izumi; Yan Jun Li; Yoshitaka Naitoh; Yasuhiro Sugawara
Journal:  Microscopy (Oxf)       Date:  2022-04-01       Impact factor: 1.571

2.  An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001).

Authors:  Antoine Hinaut; Adeline Pujol; Florian Chaumeton; David Martrou; André Gourdon; Sébastien Gauthier
Journal:  Beilstein J Nanotechnol       Date:  2012-03-12       Impact factor: 3.649

3.  Defect mediated manipulation of nanoclusters on an insulator.

Authors:  Teemu Hynninen; Gregory Cabailh; Adam S Foster; Clemens Barth
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

4.  Electrospray deposition of organic molecules on bulk insulator surfaces.

Authors:  Antoine Hinaut; Rémy Pawlak; Ernst Meyer; Thilo Glatzel
Journal:  Beilstein J Nanotechnol       Date:  2015-09-18       Impact factor: 3.649

  4 in total

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