| Literature DB >> 21727365 |
C M Park1, Y S Park, Hyunsik Im, T W Kang.
Abstract
The growth and optical properties of GaN nanorods grown on Si(111) substrates by rf plasma assisted molecular-beam epitaxy are investigated by means of field emission scanning electron microscopy and photoluminescence measurements as a function of growth time. It is clearly demonstrated that the rate of growth of the nanorod diameter starts to increase after ∼90 min because of the coalescence of neighbouring nanorods. And the optical properties of the samples grown at a high growth rate are dramatically changed due to induced defects. The critical diameter for defect-free GaN nanorods is determined as below ∼140 nm under N-rich conditions.Entities:
Year: 2006 PMID: 21727365 DOI: 10.1088/0957-4484/17/4/019
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874