Literature DB >> 21727340

Resistance switch employing a simple metal nanogap junction.

Yasuhisa Naitoh, Masayo Horikawa, Hidekazu Abe, Tetsuo Shimizu.   

Abstract

In recent years, several researchers have reported the occurrence of reversible resistance switching effects in simple metal nanogap junctions. A large negative resistance is observed in the I-V characteristics of such a junction when high-bias voltages are applied. This phenomenon is characteristic behaviour on the nanometre scale; it only occurs for gap widths slightly under 13 nm. Furthermore, such a junction exhibits a non-volatile resistance hysteresis when the bias voltage is reduced very rapidly from a high level to around 0 V, and when the bias voltage is reduced slowly. This non-volatile resistance change occurs as a result of changes in the gap width between the metal electrodes, brought about by the applied bias voltage.

Entities:  

Year:  2006        PMID: 21727340     DOI: 10.1088/0957-4484/17/22/022

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  Highly stable, extremely high-temperature, nonvolatile memory based on resistance switching in polycrystalline Pt nanogaps.

Authors:  Hiroshi Suga; Hiroya Suzuki; Yuma Shinomura; Shota Kashiwabara; Kazuhito Tsukagoshi; Tetsuo Shimizu; Yasuhisa Naitoh
Journal:  Sci Rep       Date:  2016-10-11       Impact factor: 4.379

  1 in total

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