| Literature DB >> 21727340 |
Yasuhisa Naitoh, Masayo Horikawa, Hidekazu Abe, Tetsuo Shimizu.
Abstract
In recent years, several researchers have reported the occurrence of reversible resistance switching effects in simple metal nanogap junctions. A large negative resistance is observed in the I-V characteristics of such a junction when high-bias voltages are applied. This phenomenon is characteristic behaviour on the nanometre scale; it only occurs for gap widths slightly under 13 nm. Furthermore, such a junction exhibits a non-volatile resistance hysteresis when the bias voltage is reduced very rapidly from a high level to around 0 V, and when the bias voltage is reduced slowly. This non-volatile resistance change occurs as a result of changes in the gap width between the metal electrodes, brought about by the applied bias voltage.Entities:
Year: 2006 PMID: 21727340 DOI: 10.1088/0957-4484/17/22/022
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874