| Literature DB >> 21721707 |
Shiho Iwanaga1, Eric S Toberer, Aaron LaLonde, G Jeffrey Snyder.
Abstract
A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.Year: 2011 PMID: 21721707 DOI: 10.1063/1.3601358
Source DB: PubMed Journal: Rev Sci Instrum ISSN: 0034-6748 Impact factor: 1.523