| Literature DB >> 21711725 |
Antony J Ward1, Ajit A Pujari, Lorenzo Costanzo, Anthony F Masters, Thomas Maschmeyer.
Abstract
A series of mesoporous silicas impregnated with nanocrystalline sulphated zirconia was prepared by a sol-gel process using an ionic liquid-templated route. The physicochemical properties of the mesoporous sulphated zirconia materials were studied using characterisation techniques such as inductively coupled optical emission spectroscopy, X-ray diffraction, transmission electron microscopy, energy-dispersive X-ray microanalysis, elemental analysis and X-ray photoelectron spectroscopy. Analysis of the new silicas indicates isomorphous substitution of silicon with zirconium and reveals the presence of extremely small (< 10 nm) polydispersed zirconia nanoparticles in the materials with zirconium loadings from 27.77 to 41.4 wt.%.Entities:
Year: 2011 PMID: 21711725 PMCID: PMC3211248 DOI: 10.1186/1556-276X-6-192
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1Schematic representation of the syntheses of SZ-SiO.
Physical properties of the prepared mesoporous sulphated silica-zirconia materials
| Sample | Added Zr (wt.%) | Si/Zr (mol/mol) | Zr/S | Pore diameter (Å) | ||||
|---|---|---|---|---|---|---|---|---|
| - | - | ∞ | - | - | 709 | 0.819 | 46.15 | |
| 2.2 | 1.01 | 148 | 0.05 | 7.1 | 435 | 1.343 | 123.52 | |
| 3.6 | 1.34 | 111 | 0.10 | 4.7 | 416 | 1.291 | 124.23 | |
| 7.9 | 2.43 | 60 | 0.33 | 2.6 | 482 | 1.166 | 96.89 | |
| 10.9 | 5.29 | 27 | 0.28 | 6.6 | 470 | 1.075 | 91.47 | |
| 25.0 | 15.35 | 7.8 | 0.73 | 7.4 | 424 | 1.167 | 110.08 | |
| 39.5 | 26.89 | 3.6 | 1.08 | 8.8 | 378 | 0.763 | 80.73 | |
| 45.0 | 27.77 | 3.4 | 1.22 | 8.0 | 380 | 0.558 | 58.63 | |
| 61.5 | 41.40 | 1.6 | 1.69 | 8.6 | 343 | 0.430 | 50.23 |
aDetermined by ICP-OES analysis; bdetermined by elemental analysis.
Figure 2High-angle X-ray diffraction patterns of the prepared sulphated zirconia-silica materials.
Relative concentrations of O, Zr and Si (%) at the surface of the SZ-SiO2 materials as determined by XPS
| 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | |
|---|---|---|---|---|---|---|---|---|
| O | 68.26 | 69.63 | 75.91 | 72.08 | 78.33 | 69.49 | 84.03 | 74.58 |
| Zr | 0.22 | 0.24 | 0.21 | 1.20 | 1.02 | 1.28 | 5.69 | 9.00 |
| Si | 31.53 | 30.14 | 31.53 | 26.72 | 20.65 | 29.23 | 10.28 | 16.43 |
Figure 3Representative TEM images of the prepared SZ-SiO. a Silica 3 (1.34 wt.% Zr). b Silica 4 (2.43 wt.% Zr). c Silica 8 (27.77 wt.% Zr).
Figure 4HRTEM images of the prepared SZ-SiO. a Dark field image of silica 7 (26.89 wt.% Zr). b Silica 8 (27.77 wt.% Zr). c Silica 9 (41.40 wt.% Zr).