| Literature DB >> 21711661 |
R Pratibha Nalini1, Christian Dufour, Julien Cardin, Fabrice Gourbilleau.
Abstract
In this article, we have fabricated and studied a new multilayer structure Si-SiO2/SiNx by reactive magnetron sputtering. The comparison between SiO2 and SiNx host matrices in the optical properties of the multilayers is detailed. Structural analysis was made on the multilayer structures using Fourier transform infrared spectroscopy. The effect of specific annealing treatments on the optical properties is studied and we report a higher visible luminescence with a control over the thermal budget when SiO2 is replaced by the SiNx matrix. The latter seems to be a potential candidate to replace the most sought SiO2 host matrix.Entities:
Year: 2011 PMID: 21711661 PMCID: PMC3211207 DOI: 10.1186/1556-276X-6-156
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703