| Literature DB >> 21711595 |
Manickam Sivakumar1, Krishnan Venkatakrishnan, Bo Tan.
Abstract
In this study, MHz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces under ambient condition were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction analysis (XRD), and X-ray photoelectron spectroscopy (XPS). The radiation fluence used was 0.5 J/cm2 at a pulse repetition rate of 25 MHz with 1 ms interaction time. SEM analysis of the irradiated surfaces showed self-assembled intermingled weblike nanofibrous structure in and around the laser-irradiated spots. Further TEM investigation on this nanostructure revealed that the nanofibrous structure is formed due to aggregation of Au-Si/Si nanoparticles. The XRD peaks at 32.2°, 39.7°, and 62.5° were identified as (200), (211), and (321) reflections, respectively, corresponding to gold silicide. In addition, the observed chemical shift of Au 4f and Si 2p lines in XPS spectrum of the irradiated surface illustrated the presence of gold silicide at the irradiated surface. The generation of Si/Au-Si alloy fibrous nanoparticles aggregate is explained by the nucleation and subsequent condensation of vapor in the plasma plume during irradiation and expulsion of molten material due to high plasma pressure.Entities:
Year: 2011 PMID: 21711595 PMCID: PMC3212226 DOI: 10.1186/1556-276X-6-78
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1SEM and TEM micrographs of the sample surface irradiated at laser radiation fluence (0.5 J/cm. (a) surface featuring weblike nanoparticles around the laser spot, (b, c) Si/Au-Si nanoparticles in the aggregate structure.
Figure 2TEM-EDX analysis of the nanoparticles in the aggregate structure.
Figure 3X-ray diffractograms of both treated and untreated samples. The peak at 39.7° in the treated sample is attributed to the Au-Si alloy phase.
Figure 4XPS spectra of untreated and laser treated samples for Au 4.
Figure 5XPS spectra of laser treated samples for Si 2.