Literature DB >> 21699319

Chemical resolution at ionic crystal surfaces using dynamic atomic force microscopy with metallic tips.

G Teobaldi1, K Lämmle, T Trevethan, M Watkins, A Schwarz, R Wiesendanger, A L Shluger.   

Abstract

We demonstrate that well prepared and characterized Cr tips can provide atomic resolution on the bulk NaCl(001) surface with dynamic atomic force microscopy in the noncontact regime at relatively large tip-sample separations. At these conditions, the surface chemical structure can be resolved yet tip-surface instabilities are absent. Our calculations demonstrate that chemical identification is unambiguous, because the interaction is always largest above the anions. This conclusion is generally valid for other polar surfaces, and can thus provide a new practical route for straightforward interpretation of atomically resolved images.
© 2011 American Physical Society

Entities:  

Year:  2011        PMID: 21699319     DOI: 10.1103/PhysRevLett.106.216102

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  7 in total

1.  Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip.

Authors:  Alexander Liebig; Prokop Hapala; Alfred J Weymouth; Franz J Giessibl
Journal:  Sci Rep       Date:  2020-08-24       Impact factor: 4.379

2.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Authors:  Mehmet Z Baykara; Omur E Dagdeviren; Todd C Schwendemann; Harry Mönig; Eric I Altman; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2012-09-11       Impact factor: 3.649

3.  Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy.

Authors:  Sara Freund; Antoine Hinaut; Nathalie Marinakis; Edwin C Constable; Ernst Meyer; Catherine E Housecroft; Thilo Glatzel
Journal:  Beilstein J Nanotechnol       Date:  2018-01-23       Impact factor: 3.649

4.  Defect mediated manipulation of nanoclusters on an insulator.

Authors:  Teemu Hynninen; Gregory Cabailh; Adam S Foster; Clemens Barth
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

5.  Characterization of the mechanical properties of qPlus sensors.

Authors:  Jan Berger; Martin Svec; Martin Müller; Martin Ledinský; Antonín Fejfar; Pavel Jelínek; Zsolt Majzik
Journal:  Beilstein J Nanotechnol       Date:  2013-01-02       Impact factor: 3.649

6.  Models of the interaction of metal tips with insulating surfaces.

Authors:  Thomas Trevethan; Matthew Watkins; Alexander L Shluger
Journal:  Beilstein J Nanotechnol       Date:  2012-04-13       Impact factor: 3.649

7.  Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.

Authors:  Adam Sweetman; Andrew Stannard
Journal:  Beilstein J Nanotechnol       Date:  2014-04-01       Impact factor: 3.649

  7 in total

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