In situ X-ray spectromicroscopy investigation of the material stability of SOFC metal interconnects in operating electrochemical cells.

The present in situ study of electrochemically induced processes occurring in Cr/Ni bilayers in contact with a YSZ electrolyte aims at a molecular-level understanding of the fundamental aspects related to the durability of metallic interconnects in solid oxide fuel cells (SOFCs). The results demonstrate the potential of scanning photoelectron microspectroscopy and imaging to follow in situ the evolution of the chemical states and lateral distributions of the constituent elements (Ni, Cr, Zr, and Y) as a function of applied cathodic potential in a cell working at 650 °C in 10(-6) mbar O(2) ambient conditions. The most interesting findings are the temperature-induced and potential-dependent diffusion of Ni and Cr, and the oxidation-reduction processes resulting in specific morphology-composition changes in the Ni, Cr, and YSZ areas.